Ralf Schneider

Person

Munchen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for increasing the selectivity of FET-based ga...
- Patent number 7,992,426
- Issue date Aug 9, 2011
- Micronas GmbH
- Maximilian Fleischer
- G01 - MEASURING TESTING
Information Patent Grant
Gas sensitive field-effect-transistor
- Patent number 7,772,617
- Issue date Aug 10, 2010
- Micronas GmbH
- Maximilian Fleischer
- G01 - MEASURING TESTING
Information Patent Grant
Gas-sensitive field-effect transistor with air gap
- Patent number 7,459,732
- Issue date Dec 2, 2008
- Micronas GmbH
- Maximilian Fleischer
- G01 - MEASURING TESTING
Information Patent Grant
Method for initialization of electronic circuit units, and electric...
- Patent number 7,449,925
- Issue date Nov 11, 2008
- Infineon Technologies AG
- Ralf Schneider
- G11 - INFORMATION STORAGE
Information Patent Grant
Field effect semiconductor switch and method for fabricating it
- Patent number 7,402,859
- Issue date Jul 22, 2008
- Infineon Technologies AG
- Joerg Vollrath
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit for determining a voltage
- Patent number 7,365,554
- Issue date Apr 29, 2008
- Infineon Technologies AG
- Joerg Vollrath
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated semiconduct memory with test circuit
- Patent number 7,266,027
- Issue date Sep 4, 2007
- Infineon Technologies AG
- Ralf Schneider
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated semiconductor circuit and method for testing the same
- Patent number 7,224,627
- Issue date May 29, 2007
- Infineon Technologies AG
- Marcin Gnat
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit
- Patent number 7,203,883
- Issue date Apr 10, 2007
- Infineon Technologies AG
- Aurel von Campenhausen
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit
- Patent number 7,196,537
- Issue date Mar 27, 2007
- Infineon Technologies AG
- Aurel von Campenhausen
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit for stabilizing a voltage
- Patent number 7,196,572
- Issue date Mar 27, 2007
- Infineon Technologies, AG
- Ralf Schneider
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for signaling that a predetermined time value has elapsed
- Patent number 7,116,737
- Issue date Oct 3, 2006
- Infineon Technologies AG
- Georg Erhard Eggers
- G11 - INFORMATION STORAGE
Information Patent Grant
RAM store and control method therefor
- Patent number 7,110,310
- Issue date Sep 19, 2006
- Infineon Technologies AG
- Manfred Proell
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated memory having a voltage generator circuit for generating...
- Patent number 7,068,546
- Issue date Jun 27, 2006
- Infineon Technologies AG
- Ralf Schneider
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit for storing operating parameters
- Patent number 7,042,773
- Issue date May 9, 2006
- Infineon Technologies, AG
- Ralf Schneider
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated semiconductor memory circuit and a method for operating...
- Patent number 6,965,535
- Issue date Nov 15, 2005
- Infineon Technologies AG
- Manfred Proell
- G11 - INFORMATION STORAGE
Information Patent Grant
Driver circuit having a plurality of drivers for driving signals in...
- Patent number 6,956,404
- Issue date Oct 18, 2005
- Infineon Technologies, AG
- Ralf Schneider
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated dynamic memory having a control circuit for controlling...
- Patent number 6,940,775
- Issue date Sep 6, 2005
- Infineon Technologies, AG
- Ralf Schneider
- G11 - INFORMATION STORAGE
Information Patent Grant
Voltage generator arrangement
- Patent number 6,927,557
- Issue date Aug 9, 2005
- Infineon Technologies AG
- Manfred Pröll
- G05 - CONTROLLING REGULATING
Information Patent Grant
Integrated DRAM semiconductor memory and method for operating the same
- Patent number 6,906,972
- Issue date Jun 14, 2005
- Infineon Technologies AG
- Manfred Proell
- G11 - INFORMATION STORAGE
Information Patent Grant
Voltage generator arrangement
- Patent number 6,900,626
- Issue date May 31, 2005
- Infineon Technologies, AG
- Manfred Pröll
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and device for testing a memory circuit
- Patent number 6,898,739
- Issue date May 24, 2005
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Grant
On chip scrambling
- Patent number 6,826,111
- Issue date Nov 30, 2004
- Infineon Technologies AG
- Ralf Schneider
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and device for testing set-up time and hold time of signals...
- Patent number 6,754,869
- Issue date Jun 22, 2004
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated test circuit
- Patent number 6,750,670
- Issue date Jun 15, 2004
- Infineon Technologies AG
- Thorsten Bucksch
- G01 - MEASURING TESTING
Information Patent Grant
Method and semiconductor component having a device for determining...
- Patent number 6,734,695
- Issue date May 11, 2004
- Infineon Technologies AG
- Thilo Schaffroth
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit, test structure and method for testing integrate...
- Patent number 6,618,303
- Issue date Sep 9, 2003
- Infineon Technologies AG
- Arndt Gruber
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit configuration and method for synchronization
- Patent number 6,556,486
- Issue date Apr 29, 2003
- Infineon Technologies AG
- Herbert Benzinger
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit with actuation circuit for actuating a driver ci...
- Patent number 6,351,161
- Issue date Feb 26, 2002
- Infineon Technologies AG
- Ralf Schneider
- G01 - MEASURING TESTING
Information Patent Grant
Circuit configuration for reducing disturbances due to a switching...
- Patent number 6,069,486
- Issue date May 30, 2000
- Siemens Aktiengesellschaft
- Zoltan Manyoki
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and Method for increasing the selectivity of fet-based ga...
- Publication number 20090211437
- Publication date Aug 27, 2009
- Maximilian Fleischer
- G01 - MEASURING TESTING
Information Patent Application
IC Chip Package, Test Equipment and Interface for Performing a Func...
- Publication number 20080079455
- Publication date Apr 3, 2008
- Joerg Vollrath
- G01 - MEASURING TESTING
Information Patent Application
Method of effecting a signal readout on a gas-sensitive field-effec...
- Publication number 20060278528
- Publication date Dec 14, 2006
- Maximilian Fleischer
- G01 - MEASURING TESTING
Information Patent Application
Gas-sensitive field-effect transistor with air gap
- Publication number 20060260737
- Publication date Nov 23, 2006
- Maximilian Fleischer
- G01 - MEASURING TESTING
Information Patent Application
Method for initialization of electronic circuit units, and electric...
- Publication number 20060219798
- Publication date Oct 5, 2006
- Ralf Schneider
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated semiconductor memory with test circuit
- Publication number 20060120176
- Publication date Jun 8, 2006
- Ralf Schneider
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated circuit for stabilizing a voltage
- Publication number 20050248996
- Publication date Nov 10, 2005
- Ralf Schneider
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated circuit
- Publication number 20050229054
- Publication date Oct 13, 2005
- Aurel von Campenhausen
- G01 - MEASURING TESTING
Information Patent Application
Integrated semiconductor circuit and method for testing the same
- Publication number 20050225917
- Publication date Oct 13, 2005
- Marcin Gnat
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated circuit
- Publication number 20050218960
- Publication date Oct 6, 2005
- Aurel von Campenhausen
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit for determining a voltage
- Publication number 20050213269
- Publication date Sep 29, 2005
- Joerg Vollrath
- G01 - MEASURING TESTING
Information Patent Application
Field effect semiconductor switch and method for fabricating it
- Publication number 20050205946
- Publication date Sep 22, 2005
- Infineon Technologies AG
- Jorg Vollrath
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit for storing operating parameters
- Publication number 20050135163
- Publication date Jun 23, 2005
- Ralf Schneider
- G11 - INFORMATION STORAGE
Information Patent Application
Memory chip having an integrated address scrambler unit and method...
- Publication number 20040260934
- Publication date Dec 23, 2004
- Manfred Proll
- G11 - INFORMATION STORAGE
Information Patent Application
Synchronizer signal generator device and process for generating a s...
- Publication number 20040246033
- Publication date Dec 9, 2004
- Infineon Technologies AG
- Georg Eggers
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
RAM store and control method therefor
- Publication number 20040233747
- Publication date Nov 25, 2004
- Manfred Proell
- G11 - INFORMATION STORAGE
Information Patent Application
Driver circuit having a plurality of drivers for driving signals in...
- Publication number 20040222820
- Publication date Nov 11, 2004
- Ralf Schneider
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Integrated memory having a voltage generator circuit for generating...
- Publication number 20040223376
- Publication date Nov 11, 2004
- Ralf Schneider
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated dynamic memory having a control circuit for controlling...
- Publication number 20040218458
- Publication date Nov 4, 2004
- Ralf Schneider
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated semiconductor memory circuit and a method for operating...
- Publication number 20040184333
- Publication date Sep 23, 2004
- Manfred Proell
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated DRAM semiconductor memory and method for operating the same
- Publication number 20040170049
- Publication date Sep 2, 2004
- Manfred Proell
- G11 - INFORMATION STORAGE
Information Patent Application
Voltage generator arrangement
- Publication number 20040130310
- Publication date Jul 8, 2004
- Manfred Proll
- G05 - CONTROLLING REGULATING
Information Patent Application
Voltage generator arrangement
- Publication number 20040124824
- Publication date Jul 1, 2004
- Manfred Proll
- G05 - CONTROLLING REGULATING
Information Patent Application
Integrated test circuit
- Publication number 20030107392
- Publication date Jun 12, 2003
- Thorsten Bucksch
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for signaling that a predetermined time value has elapsed
- Publication number 20030072399
- Publication date Apr 17, 2003
- George Erhard Eggers
- G04 - HOROLOGY
Information Patent Application
On chip scrambling
- Publication number 20030048672
- Publication date Mar 13, 2003
- Ralf Schneider
- G11 - INFORMATION STORAGE
Information Patent Application
Method and device for testing a memory circuit
- Publication number 20020174386
- Publication date Nov 21, 2002
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Application
Method and semiconductor component having a device for determining...
- Publication number 20020125906
- Publication date Sep 12, 2002
- Thilo Shaffroth
- G01 - MEASURING TESTING
Information Patent Application
Input circuit for an integrated memory
- Publication number 20020075748
- Publication date Jun 20, 2002
- Herbert Benzinger
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit configuration and method for synchronization
- Publication number 20020071335
- Publication date Jun 13, 2002
- Herbert Benzinger
- G11 - INFORMATION STORAGE

Ralf Schneider

Person

Patents Grantslast 30 patents

Apparatus and method for increasing the selectivity of FET-based ga...

Gas sensitive field-effect-transistor

Gas-sensitive field-effect transistor with air gap

Method for initialization of electronic circuit units, and electric...

Field effect semiconductor switch and method for fabricating it

Integrated circuit for determining a voltage

Integrated semiconduct memory with test circuit

Integrated semiconductor circuit and method for testing the same

Integrated circuit

Integrated circuit

Integrated circuit for stabilizing a voltage

Apparatus for signaling that a predetermined time value has elapsed

RAM store and control method therefor

Integrated memory having a voltage generator circuit for generating...

Integrated circuit for storing operating parameters

Integrated semiconductor memory circuit and a method for operating...

Driver circuit having a plurality of drivers for driving signals in...

Integrated dynamic memory having a control circuit for controlling...

Voltage generator arrangement

Integrated DRAM semiconductor memory and method for operating the same

Voltage generator arrangement

Method and device for testing a memory circuit

On chip scrambling

Method and device for testing set-up time and hold time of signals...

Integrated test circuit

Method and semiconductor component having a device for determining...

Integrated circuit, test structure and method for testing integrate...

Circuit configuration and method for synchronization

Integrated circuit with actuation circuit for actuating a driver ci...

Circuit configuration for reducing disturbances due to a switching...

Patents Applicationslast 30 patents

Apparatus and Method for increasing the selectivity of fet-based ga...

IC Chip Package, Test Equipment and Interface for Performing a Func...

Method of effecting a signal readout on a gas-sensitive field-effec...

Gas-sensitive field-effect transistor with air gap

Method for initialization of electronic circuit units, and electric...

Integrated semiconductor memory with test circuit

Integrated circuit for stabilizing a voltage

Integrated circuit

Integrated semiconductor circuit and method for testing the same

Integrated circuit

Integrated circuit for determining a voltage

Field effect semiconductor switch and method for fabricating it

Integrated circuit for storing operating parameters

Memory chip having an integrated address scrambler unit and method...

Synchronizer signal generator device and process for generating a s...

RAM store and control method therefor

Driver circuit having a plurality of drivers for driving signals in...

Integrated memory having a voltage generator circuit for generating...

Integrated dynamic memory having a control circuit for controlling...

Integrated semiconductor memory circuit and a method for operating...

Integrated DRAM semiconductor memory and method for operating the same

Voltage generator arrangement

Voltage generator arrangement

Integrated test circuit

Apparatus for signaling that a predetermined time value has elapsed

On chip scrambling

Method and device for testing a memory circuit

Method and semiconductor component having a device for determining...

Input circuit for an integrated memory

Circuit configuration and method for synchronization