Ralf Sonnhueter

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Schrobenhausen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Automatic test equipment for testing an oscillating crystal and met...
- Patent number 9,523,733
- Issue date Dec 20, 2016
- Texas Instruments Incorporated
- Ralf Sonnhueter
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test equipment for testing an oscillating crystal and met...
- Patent number 8,872,523
- Issue date Oct 28, 2014
- Texas Instruments Deutschland GmbH
- Ralf Sonnhueter
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board and method for automatic testing
- Patent number 7,863,921
- Issue date Jan 4, 2011
- Texas Instruments Deutschland GmbH
- Ralf Sonnhueter
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit device
- Patent number 7,400,130
- Issue date Jul 15, 2008
- Texas Instruments Deutschland GmbH
- Joern Naujokat
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC TEST EQUIPMENT FOR TESTING AN OSCILLATING CRYSTAL AND MET...
- Publication number 20150042368
- Publication date Feb 12, 2015
- Texas Instruments Deutschland GmbH
- Ralf Sonnhueter
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT FOR TESTING AN OSCILLATING CRYSTAL AND MET...
- Publication number 20120112761
- Publication date May 10, 2012
- Texas Instruments Deutschland GmbH
- Ralf Sonnhueter
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD AND METHOD FOR AUTOMATIC TESTING
- Publication number 20090091331
- Publication date Apr 9, 2009
- Texas Instruments Deutschland GmbH
- Ralf Sonnhueter
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DEVICE
- Publication number 20070052487
- Publication date Mar 8, 2007
- TEXAS INSTRUMENTS DEUTSCHLAND
- Joern Naujokat
- H03 - BASIC ELECTRONIC CIRCUITRY