Ralf Stolte

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Hamburg, DE

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Patents Grantslast 30 patents

Information Patent Grant
Determination of optical properties of a device under test in both...
- Patent number 7,268,342
- Issue date Sep 11, 2007
- Agilent Technologies, Inc.
- Patrick Ziegler
- G01 - MEASURING TESTING
Information Patent Grant
Reflectometric insertion loss measurements for optical components
- Patent number 6,970,237
- Issue date Nov 29, 2005
- Agilent Technologies Inc.
- Ralf Stolte
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength measurement adjustment
- Patent number 6,798,522
- Issue date Sep 28, 2004
- Agilent Technologies, Inc.
- Ralf Stolte
- G01 - MEASURING TESTING
Information Patent Grant
Determination of optical properties of a device under test in trans...
- Patent number 6,788,396
- Issue date Sep 7, 2004
- Agilent Technologies, Inc.
- Ralf Stolte
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of polarization dependent characteristic of optical com...
- Patent number 6,671,038
- Issue date Dec 30, 2003
- Agilent Technologies, Inc.
- Ralf Stolte
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Determination of optical properties of a device under test in both...
- Publication number 20050121633
- Publication date Jun 9, 2005
- Patrick Ziegler
- G01 - MEASURING TESTING
Information Patent Application
Calibration and/or verification of a measurement setup
- Publication number 20030020899
- Publication date Jan 30, 2003
- AGILENT TECHNOLOGIES, INC.
- Ralf Stolte
- G01 - MEASURING TESTING
Information Patent Application
Determination of optical properties of a device under test in trans...
- Publication number 20030020900
- Publication date Jan 30, 2003
- AGILENT TECHNOLOGIES, INC.
- Ralf Stolte
- G01 - MEASURING TESTING
Information Patent Application
Measurement of polarization dependent characteristic of optical com...
- Publication number 20020196426
- Publication date Dec 26, 2002
- AGILENT TECHNOLOGIES, INC.
- Ralf Stolte
- G01 - MEASURING TESTING
Information Patent Application
Wavelength measurement adjustment
- Publication number 20020149779
- Publication date Oct 17, 2002
- Ralf Stolte
- G01 - MEASURING TESTING