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Ralfy KENAZ
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Jerusalem, IL
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last 30 patents
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Patent Grant
System and method for use in high spatial resolution ellipsometry
Patent number
11,262,293
Issue date
Mar 1, 2022
Ronen Rapaport
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SYSTEM AND METHOD FOR USE IN HIGH SPATIAL RESOLUTION ELLIPSOMETRY
Publication number
20200025678
Publication date
Jan 23, 2020
Yissum Research Development Company of the Hebrew University of Jerusalem Ltd.
Ronen RAPAPORT
G01 - MEASURING TESTING