Ralph E. Hayles, JR.

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San Antonio, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for highly directional electronic identification...
- Patent number 8,115,697
- Issue date Feb 14, 2012
- ATR Electronics, LLC
- Ralph E. Hayles, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
System and method for position or range estimation, tracking and se...
- Patent number 7,580,004
- Issue date Aug 25, 2009
- Location & Tracking Technologies, LLC
- Ralph E. Hayles, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
System and method for interrogating and locating a transponder rela...
- Patent number 7,573,369
- Issue date Aug 11, 2009
- ATR Electronics, Inc.
- Ralph E. Hayles, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
System and method for highly directional electronic identification...
- Patent number 7,196,655
- Issue date Mar 27, 2007
- ATR Electronics, Inc.
- Ralph E. Hayles, Jr.
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR HIGHLY DIRECTIONAL ELECTRONIC IDENTIFICATION...
- Publication number 20120122403
- Publication date May 17, 2012
- Ralph E. Hayles, JR.
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR HIGHLY DIRECTIONAL ELECTRONIC IDENTIFICATION...
- Publication number 20110148703
- Publication date Jun 23, 2011
- Ralph E. Hayles, JR.
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Interrogating and Locating a Transponder Rela...
- Publication number 20070069886
- Publication date Mar 29, 2007
- ATR Electronics, Incorporated
- Ralph E. Hayles, Jr.
- G01 - MEASURING TESTING