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Ralph H. Johnson
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Plano, TX, US
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last 30 patents
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Patent Grant
Method for micromachining semiconductor material
Patent number
5,225,377
Issue date
Jul 6, 1993
Honeywell Inc.
John R. Hines
G01 - MEASURING TESTING
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Patent Grant
Pressure transducer with reduced offset signal
Patent number
5,174,156
Issue date
Dec 29, 1992
Honeywell Inc.
Ralph H. Johnson
G01 - MEASURING TESTING
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Patent Grant
Ribbed and bossed pressure transducer
Patent number
5,156,052
Issue date
Oct 20, 1992
Honeywell Inc.
Ralph H. Johnson
G01 - MEASURING TESTING