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Ralph L. Carter
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Thame, GB
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Patents Grants
last 30 patents
Information
Patent Grant
Diffuse reflectance infrared fourier transform spectroscopy
Patent number
11,156,549
Issue date
Oct 26, 2021
PERKINELMER SINGAPORE PTE LIMITED
Ralph Lance Carter
G01 - MEASURING TESTING
Information
Patent Grant
Diffuse reflectance infrared Fourier transform spectroscopy
Patent number
10,473,584
Issue date
Nov 12, 2019
PERKINELMER SINGAPORE PTE LIMITED
Ralph Lance Carter
G01 - MEASURING TESTING
Information
Patent Grant
Sample spinners and spectrometers including sample spinners
Patent number
9,983,119
Issue date
May 29, 2018
PERKINELMER SINGAPORE PTE LIMITED
Ralph Lance Carter
G01 - MEASURING TESTING
Information
Patent Grant
Diffuse reflectance infrared Fourier transform spectroscopy
Patent number
9,976,949
Issue date
May 22, 2018
PERKINELMER SINGAPORE PTE LIMITED
Ralph Lance Carter
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic instrument
Patent number
9,322,703
Issue date
Apr 26, 2016
PerkinElmer Singapore PTE. LTD.
Robert Alan Hoult
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for attenuated total internal reflectance (ATR)...
Patent number
8,743,456
Issue date
Jun 3, 2014
PerkinElmer Singapore PTE. LTD.
Robert Alan Hoult
G02 - OPTICS
Information
Patent Grant
Accessory for attenuated total internal reflectance (ATR) spectroscopy
Patent number
8,400,711
Issue date
Mar 19, 2013
PerkinElmer Singapore PTE. LTD.
Robert Alan Hoult
G01 - MEASURING TESTING
Information
Patent Grant
Accessory for attenuated total internal reflectance (ATR) spectroscopy
Patent number
8,355,202
Issue date
Jan 15, 2013
PerkinElmer Singapore PTE. LTD.
Robert Alan Hoult
Information
Patent Grant
Accessory for attenuated total internal reflective (ATR) spectroscopy
Patent number
8,223,429
Issue date
Jul 17, 2012
PerkinElmer Singapore PTE. LTD.
Robert Alan Hoult
G01 - MEASURING TESTING
Information
Patent Grant
Accessory for attenuated total internal reflectance (ATR) spectroscopy
Patent number
8,223,430
Issue date
Jul 17, 2012
PerkinElmer Singapore PTE. LTD.
Robert Alan Hoult
G01 - MEASURING TESTING
Information
Patent Grant
Accessory for attenuated total internal reflectance (ATR) spectroscopy
Patent number
7,935,929
Issue date
May 3, 2011
PerkinElmer Singapore PTE. LTD.
Robert Alan Hoult
G01 - MEASURING TESTING
Information
Patent Grant
Scanning IR microscope
Patent number
7,057,733
Issue date
Jun 6, 2006
Singapore Pte. Ltd.
Ralph Lance Carter
G01 - MEASURING TESTING
Information
Patent Grant
Ellipsoidal mirror
Patent number
6,676,265
Issue date
Jan 13, 2004
PerkinElmer International C.V.
Ralph Lance Carter
G02 - OPTICS
Information
Patent Grant
Infrared microscope stage control
Patent number
6,006,140
Issue date
Dec 21, 1999
Perkin-Elmer Ltd.
Ralph L. Carter
G02 - OPTICS
Information
Patent Grant
Standardization of chromatographic systems
Patent number
5,958,246
Issue date
Sep 28, 1999
The Perkin-Elmer Corporation
Andrew Tipler
G01 - MEASURING TESTING
Information
Patent Grant
Microscope aperture control
Patent number
5,946,131
Issue date
Aug 31, 1999
Perkin-Elmer Ltd.
Simon Wells
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
RAMAN SPECTROMETER
Publication number
20230027486
Publication date
Jan 26, 2023
PerkinElmer Singapore Pte. Ltd.
Ben PERSTON
G01 - MEASURING TESTING
Information
Patent Application
DIFFUSE REFLECTANCE INFRARED FOURIER TRANSFORM SPECTROSCOPY
Publication number
20200103338
Publication date
Apr 2, 2020
PERKINELMER SINGAPORE PTE LIMITED
Ralph Lance Carter
G01 - MEASURING TESTING
Information
Patent Application
DIFFUSE REFLECTANCE INFRARED FOURIER TRANSFORM SPECTROSCOPY
Publication number
20180266942
Publication date
Sep 20, 2018
PerkinElmer Singapore Pte. Ltd.
Ralph Lance Carter
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE SPINNERS AND SPECTROMETERS INCLUDING SAMPLE SPINNERS
Publication number
20160370284
Publication date
Dec 22, 2016
Ralph Lance CARTER
G01 - MEASURING TESTING
Information
Patent Application
DIFFUSE REFLECTANCE INFRARED FOURIER TRANSFORM SPECTROSCOPY
Publication number
20160178509
Publication date
Jun 23, 2016
PERKINELMER SINGAPORE PTE LIMITED
Ralph Lance CARTER
G01 - MEASURING TESTING
Information
Patent Application
ACCESSORY FOR ATTENUATED TOTAL INTERNAL REFLECTANCE (ATR) SPECTROSCOPY
Publication number
20130301923
Publication date
Nov 14, 2013
Robert Alan Hoult
G02 - OPTICS
Information
Patent Application
SPECTROSCOPIC INSTRUMENT
Publication number
20130220014
Publication date
Aug 29, 2013
PerkinElmer Singapore Pte. Ltd.
Robert Alan Hoult
G02 - OPTICS
Information
Patent Application
Accessory for attenuated total internal reflectance (ATR) spectroscopy
Publication number
20090127463
Publication date
May 21, 2009
PerkinElmer Singapore Pte. Ltd.
Robert Alan Hoult
G02 - OPTICS
Information
Patent Application
ACCESSORY FOR ATTENUATED TOTAL INTERNAL REFLECTANCE (ATR) SPECTROSCOPY
Publication number
20090034065
Publication date
Feb 5, 2009
PerkinElmer Singapore PTE Ltd.
Robert Alan Hoult
G02 - OPTICS
Information
Patent Application
Accessory For Attenuated Total Internal Reflective (Atr) Spectroscopy
Publication number
20090002815
Publication date
Jan 1, 2009
PekinElmer Singapore PTE Ltd.
Robert Alan Hoult
G02 - OPTICS
Information
Patent Application
Accessory for Attenuated Total Internal Reflectance (Atr) Spectroscopy
Publication number
20080285122
Publication date
Nov 20, 2008
Perkin Elmer Singapore PTE Ltd.
Robert Alan Hoult
G02 - OPTICS
Information
Patent Application
Scanning IR microscope
Publication number
20040222378
Publication date
Nov 11, 2004
Ralph Lance Carter
G02 - OPTICS
Information
Patent Application
Ellipsodial mirror
Publication number
20040080843
Publication date
Apr 29, 2004
Ralph Lance Carter
G02 - OPTICS
Information
Patent Application
Dual magnification for infrared imaging microscope
Publication number
20020034000
Publication date
Mar 21, 2002
Robert Alan Hoult
G02 - OPTICS
Information
Patent Application
Ellipsoidal mirror
Publication number
20020034025
Publication date
Mar 21, 2002
Ralph Lance Carter
G02 - OPTICS