Ralph Nyffenegger

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Palo Alto, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Creating multiple electron beams with a photocathode film
- Patent number 12,283,453
- Issue date Apr 22, 2025
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system of image-forming multi-electron beams
- Patent number 12,165,831
- Issue date Dec 10, 2024
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tilt-column multi-beam electron microscopy system and method
- Patent number 12,068,129
- Issue date Aug 20, 2024
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for accurate measurement and mapping of forwar...
- Patent number 9,746,514
- Issue date Aug 29, 2017
- KLA-Tencor Corporation
- Ian Sierra Gabriel Kelly-Morgan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TILT-COLUMN MULTI-BEAM ELECTRON MICROSCOPY SYSTEM AND METHOD
- Publication number 20240153737
- Publication date May 9, 2024
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM OF IMAGE-FORMING MULTI-ELECTRON BEAMS
- Publication number 20240096586
- Publication date Mar 21, 2024
- KLA Corporation
- Xinrong JIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Creating Multiple Electron Beams with a Photocathode Film
- Publication number 20230395349
- Publication date Dec 7, 2023
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT-EMITTING DEVICE TEST SYSTEMS
- Publication number 20150316604
- Publication date Nov 5, 2015
- KLA-Tencor Corporation
- Mark MCCORD
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Accurate Measurement and Mapping of Forwar...
- Publication number 20150061714
- Publication date Mar 5, 2015
- KLA-Tencor Corporation
- Ian Sierra Gabriel Kelly-Morgan
- G01 - MEASURING TESTING