Ralph Peter ANTONIO

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Los Gatos, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
In-situ light detection methods and apparatus for ultraviolet semic...
- Patent number 11,215,934
- Issue date Jan 4, 2022
- Applied Materials, Inc.
- Ralph Peter Antonio
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Advanced in-situ particle detection system for semiconductor substr...
- Patent number 10,883,932
- Issue date Jan 5, 2021
- Applied Materials, Inc.
- Lin Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Advanced in-situ particle detection system for semiconductor substr...
- Patent number 10,365,216
- Issue date Jul 30, 2019
- Applied Materials, Inc.
- Lin Zhang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS FOR PROCESSING A SUBSTRATE
- Publication number 20240170311
- Publication date May 23, 2024
- Ralph P. ANTONIO
- G01 - MEASURING TESTING
Information Patent Application
IN-SITU INTEGRATED WAFER PARAMETER DETECTION SYSTEM
- Publication number 20230378006
- Publication date Nov 23, 2023
- Shuran SHENG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IN-SITU LIGHT DETECTION METHODS AND APPARATUS FOR ULTRAVIOLET SEMIC...
- Publication number 20210223707
- Publication date Jul 22, 2021
- Applied Materials, Inc.
- RALPH PETER ANTONIO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ADVANCED IN-SITU PARTICLE DETECTION SYSTEM FOR SEMICONDUCTOR SUBSTR...
- Publication number 20190323960
- Publication date Oct 24, 2019
- Applied Materials, Inc.
- Lin ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADVANCED IN-SITU PARTICLE DETECTION SYSTEM FOR SEMICONDUCTOR SUBSTR...
- Publication number 20180156727
- Publication date Jun 7, 2018
- Applied Materials, Inc.
- Lin ZHANG
- G01 - MEASURING TESTING