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Ralph Peter ANTONIO
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Los Gatos, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Methods and apparatus for processing a substrate
Patent number
12,288,704
Issue date
Apr 29, 2025
Applied Materials, Inc.
Ralph P. Antonio
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
In-situ light detection methods and apparatus for ultraviolet semic...
Patent number
11,215,934
Issue date
Jan 4, 2022
Applied Materials, Inc.
Ralph Peter Antonio
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Advanced in-situ particle detection system for semiconductor substr...
Patent number
10,883,932
Issue date
Jan 5, 2021
Applied Materials, Inc.
Lin Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Advanced in-situ particle detection system for semiconductor substr...
Patent number
10,365,216
Issue date
Jul 30, 2019
Applied Materials, Inc.
Lin Zhang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHODS AND APPARATUS FOR PROCESSING A SUBSTRATE
Publication number
20240170311
Publication date
May 23, 2024
Ralph P. ANTONIO
G01 - MEASURING TESTING
Information
Patent Application
IN-SITU INTEGRATED WAFER PARAMETER DETECTION SYSTEM
Publication number
20230378006
Publication date
Nov 23, 2023
Shuran SHENG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IN-SITU LIGHT DETECTION METHODS AND APPARATUS FOR ULTRAVIOLET SEMIC...
Publication number
20210223707
Publication date
Jul 22, 2021
Applied Materials, Inc.
RALPH PETER ANTONIO
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
ADVANCED IN-SITU PARTICLE DETECTION SYSTEM FOR SEMICONDUCTOR SUBSTR...
Publication number
20190323960
Publication date
Oct 24, 2019
Applied Materials, Inc.
Lin ZHANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ADVANCED IN-SITU PARTICLE DETECTION SYSTEM FOR SEMICONDUCTOR SUBSTR...
Publication number
20180156727
Publication date
Jun 7, 2018
Applied Materials, Inc.
Lin ZHANG
G01 - MEASURING TESTING