Ralph Pulwey

Person

Aalen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for raster scanning a surface of an object usin...
- Patent number 11,504,798
- Issue date Nov 22, 2022
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for operating a plurality of FIB-SEM systems
- Patent number 10,615,002
- Issue date Apr 7, 2020
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for raster scanning a surface of an object usin...
- Patent number 10,279,419
- Issue date May 7, 2019
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for processing and/or for observing an object, and particle...
- Patent number 9,685,300
- Issue date Jun 20, 2017
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for analyzing and/or processing an object as well as a parti...
- Patent number 9,558,911
- Issue date Jan 31, 2017
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for processing and/or for observing an object, and particle...
- Patent number 9,251,997
- Issue date Feb 2, 2016
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam device having a sample holder
- Patent number 9,190,242
- Issue date Nov 17, 2015
- Carl Zeiss NTS GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for scanning a surface of an object using a pa...
- Patent number 9,136,090
- Issue date Sep 15, 2015
- Carl Zeiss Microscopy GmbH
- Ralph Pulwey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system and method for operating the same
- Patent number 8,927,948
- Issue date Jan 6, 2015
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam system and method of operating an ion beam system
- Patent number 8,921,805
- Issue date Dec 30, 2014
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of processing of an object
- Patent number 8,816,303
- Issue date Aug 26, 2014
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system
- Patent number 8,759,796
- Issue date Jun 24, 2014
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system and method for operating the same
- Patent number 8,723,136
- Issue date May 13, 2014
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam system and method of operating ion beam system
- Patent number 8,710,451
- Issue date Apr 29, 2014
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing a representation of an object by means of a pa...
- Patent number 8,471,202
- Issue date Jun 25, 2013
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR OPERATING A PLURALITY OF FIB-SEM SYSTEMS
- Publication number 20200027696
- Publication date Jan 23, 2020
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR RASTER SCANNING A SURFACE OF AN OBJECT USIN...
- Publication number 20190270159
- Publication date Sep 5, 2019
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD FOR PROCESSING AND/OR FOR OBSERVING AN OBJECT, AND PARTICLE...
- Publication number 20160181058
- Publication date Jun 23, 2016
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ANALYZING AND/OR PROCESSING AN OBJECT AS WELL AS A PARTI...
- Publication number 20160035534
- Publication date Feb 4, 2016
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING THE SAME
- Publication number 20150144801
- Publication date May 28, 2015
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PROCESSING AND/OR FOR OBSERVING AN OBJECT, AND PARTICLE...
- Publication number 20150048248
- Publication date Feb 19, 2015
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING THE SAME
- Publication number 20140217303
- Publication date Aug 7, 2014
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam System and Method of Operating an Ion Beam System
- Publication number 20140197328
- Publication date Jul 17, 2014
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Scanning a Surface of an Object Using a Pa...
- Publication number 20130320226
- Publication date Dec 5, 2013
- CARL ZEISS MICROSCOPY GMBH
- Ralph Pulwey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PRODUCING A REPRESENTATION OF AN OBJECT BY MEANS OF A PA...
- Publication number 20130270437
- Publication date Oct 17, 2013
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems for Raster Scanning a Surface of an Object Usin...
- Publication number 20130180962
- Publication date Jul 18, 2013
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING THE SAME
- Publication number 20130082188
- Publication date Apr 4, 2013
- Carl Zeiss Mocroscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam System and Method of Operating Ion Beam System
- Publication number 20120256098
- Publication date Oct 11, 2012
- CARL ZEISS NTS GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Processing of an Object
- Publication number 20120145895
- Publication date Jun 14, 2012
- CARL ZEISS NTS GMBH
- Josef BIBERGER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM DEVICE HAVING A SAMPLE HOLDER
- Publication number 20120074320
- Publication date Mar 29, 2012
- Josef BIBERGER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle Beam System
- Publication number 20120025093
- Publication date Feb 2, 2012
- CARL ZEISS NTS GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for producing a representation of an object by means of a pa...
- Publication number 20110198497
- Publication date Aug 18, 2011
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS

Ralph Pulwey

Person

Patents Grantslast 30 patents

Methods and systems for raster scanning a surface of an object usin...

Method for operating a plurality of FIB-SEM systems

Methods and systems for raster scanning a surface of an object usin...

Method for processing and/or for observing an object, and particle...

Method for analyzing and/or processing an object as well as a parti...

Method for processing and/or for observing an object, and particle...

Particle beam device having a sample holder

Method and apparatus for scanning a surface of an object using a pa...

Particle beam system and method for operating the same

Ion beam system and method of operating an ion beam system

Method of processing of an object

Particle beam system

Particle beam system and method for operating the same

Ion beam system and method of operating ion beam system

Method for producing a representation of an object by means of a pa...

Patents Applicationslast 30 patents

METHOD FOR OPERATING A PLURALITY OF FIB-SEM SYSTEMS

METHODS AND SYSTEMS FOR RASTER SCANNING A SURFACE OF AN OBJECT USIN...

METHOD FOR PROCESSING AND/OR FOR OBSERVING AN OBJECT, AND PARTICLE...

METHOD FOR ANALYZING AND/OR PROCESSING AN OBJECT AS WELL AS A PARTI...

PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING THE SAME

METHOD FOR PROCESSING AND/OR FOR OBSERVING AN OBJECT, AND PARTICLE...

PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING THE SAME

Ion Beam System and Method of Operating an Ion Beam System

Method and Apparatus for Scanning a Surface of an Object Using a Pa...

METHOD FOR PRODUCING A REPRESENTATION OF AN OBJECT BY MEANS OF A PA...

Methods and Systems for Raster Scanning a Surface of an Object Usin...

PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING THE SAME

Ion Beam System and Method of Operating Ion Beam System

Method of Processing of an Object

PARTICLE BEAM DEVICE HAVING A SAMPLE HOLDER

Particle Beam System

Method for producing a representation of an object by means of a pa...