Ralph Thomas Johnson

Person

Los Gatos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Interleaved acousto-optical device scanning for suppression of opti...
- Patent number 10,060,884
- Issue date Aug 28, 2018
- KLA-Tencor Corporation
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Multi-spot scanning collection optics
- Patent number 9,970,883
- Issue date May 15, 2018
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Grant
Multi-spot scanning collection optics
- Patent number 9,546,962
- Issue date Jan 17, 2017
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Grant
Interleaved acousto-optical device scanning for suppression of opti...
- Patent number 9,395,340
- Issue date Jul 19, 2016
- KLA-Tencor Corporation
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for scanning a beam of light across a specimen
- Patent number 6,775,051
- Issue date Aug 10, 2004
- KLA Tencor Technologies
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Two-dimensional UV compatible programmable spatial filter
- Patent number 6,686,995
- Issue date Feb 3, 2004
- KLA-Tencor Technologies Corporation
- Dieter E. Wilk
- G01 - MEASURING TESTING
Information Patent Grant
Particle detection system employing a subsystem for collecting scat...
- Patent number 5,604,585
- Issue date Feb 18, 1997
- Tencor Instruments
- Ralph Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam inspection system and method
- Patent number 5,502,306
- Issue date Mar 26, 1996
- KLA Instruments Corporation
- Dan Meisburger
- G01 - MEASURING TESTING
Information Patent Grant
Process for inspecting patterned wafers
- Patent number 5,355,212
- Issue date Oct 11, 1994
- Tencor Instruments
- Keith B. Wells
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-SPOT SCANNING COLLECTION OPTICS
- Publication number 20170115232
- Publication date Apr 27, 2017
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Application
Interleaved Acousto-Optical Device Scanning For Suppression Of Opti...
- Publication number 20160290971
- Publication date Oct 6, 2016
- KLA-Tencor Corporation
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SPOT SCANNING COLLECTION OPTICS
- Publication number 20150226677
- Publication date Aug 13, 2015
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Application
Interleaved Acousto-Optical Device Scanning For Suppression Of Opti...
- Publication number 20140260640
- Publication date Sep 18, 2014
- KLA-Tencor Corporation Drive
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Application
TWO-DIMENSIONAL UV COMPATIBLE PROGRAMMABLE SPATIAL FILTER
- Publication number 20040001198
- Publication date Jan 1, 2004
- KLA-Tencor Technologies Corporation
- Dieter E. Wilk
- G02 - OPTICS
Information Patent Application
Systems and methods for scanning a beam of light across a specimen
- Publication number 20020181119
- Publication date Dec 5, 2002
- Jamie Sullivan
- G01 - MEASURING TESTING

Ralph Thomas Johnson

Person

Patents Grantslast 30 patents

Interleaved acousto-optical device scanning for suppression of opti...

Multi-spot scanning collection optics

Multi-spot scanning collection optics

Interleaved acousto-optical device scanning for suppression of opti...

Systems and methods for scanning a beam of light across a specimen

Two-dimensional UV compatible programmable spatial filter

Particle detection system employing a subsystem for collecting scat...

Electron beam inspection system and method

Process for inspecting patterned wafers

Patents Applicationslast 30 patents

MULTI-SPOT SCANNING COLLECTION OPTICS

Interleaved Acousto-Optical Device Scanning For Suppression Of Opti...

MULTI-SPOT SCANNING COLLECTION OPTICS

Interleaved Acousto-Optical Device Scanning For Suppression Of Opti...

TWO-DIMENSIONAL UV COMPATIBLE PROGRAMMABLE SPATIAL FILTER

Systems and methods for scanning a beam of light across a specimen