Ralph Trunk

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Bischberg, DE

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Patents Grantslast 30 patents

Information Patent Grant
Particle measurement configuration and semiconductor wafer processi...
- Patent number 7,000,454
- Issue date Feb 21, 2006
- Infineon Technologies AG
- Claus Schneider
- B08 - CLEANING
Information Patent Grant
Configuration for determining a concentration of contaminating part...
- Patent number 6,928,892
- Issue date Aug 16, 2005
- Infineon Technologies AG
- Olaf Storbeck
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Configuration for determining a concentration of contaminating part...
- Publication number 20030047012
- Publication date Mar 13, 2003
- Olaf Storbeck
- G01 - MEASURING TESTING
Information Patent Application
Particle measurement configuration and semiconductor wafer processi...
- Publication number 20030041969
- Publication date Mar 6, 2003
- Claus Schneider
- G01 - MEASURING TESTING