Ralph Weisner

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Canoga Park, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Z-axis measurement system
- Patent number 4,920,273
- Issue date Apr 24, 1990
- View Engineering, Inc.
- Jack Sacks
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device inspection system
- Patent number 4,872,052
- Issue date Oct 3, 1989
- View Engineering, Inc.
- Valerie A. Liudzius
- G01 - MEASURING TESTING
Information Patent Grant
Z-axis height measurement system
- Patent number 4,743,771
- Issue date May 10, 1988
- View Engineering, Inc.
- Jack Sacks
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for illuminating objects for vision systems
- Patent number 4,706,168
- Issue date Nov 10, 1987
- View Engineering, Inc.
- Ralph M. Weisner
- G01 - MEASURING TESTING
Information Patent Grant
Integrating densitometer
- Patent number 4,417,818
- Issue date Nov 29, 1983
- Ralph M. Weisner
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS