Raluca POPESCU

Person

San Mateo, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Scanner based optical proximity correction system and method of use
- Patent number 10,234,756
- Issue date Mar 19, 2019
- Nikon Corporation
- Jacek Tyminski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanner based optical proximity correction system and method of use
- Patent number 9,753,363
- Issue date Sep 5, 2017
- Nikon Corporation
- Jacek Tyminski
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Predicting pattern critical dimensions in a lithographic exposure p...
- Patent number 9,529,253
- Issue date Dec 27, 2016
- Nikon Precision Inc.
- Jacek K. Tyminski
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Scanner based optical proximity correction system and method of use
- Patent number 9,286,416
- Issue date Mar 15, 2016
- Nikon Corporation
- Jacek Tyminski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Predicting pattern critical dimensions in a lithographic exposure p...
- Patent number 8,572,518
- Issue date Oct 29, 2013
- Nikon Precision Inc.
- Jacek K. Tyminski
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Scanner based optical proximity correction system and method of use
- Patent number 8,365,107
- Issue date Jan 29, 2013
- Nikon Corporation
- Jacek Tyminski
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNER BASED OPTICAL PROXIMITY CORRECTION SYSTEM AND METHOD OF USE
- Publication number 20190163050
- Publication date May 30, 2019
- Nikon Corporation
- Jacek TYMINSKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNER BASED OPTICAL PROXIMITY CORRECTION SYSTEM AND METHOD OF USE
- Publication number 20170363951
- Publication date Dec 21, 2017
- Nikon Corporation
- Jacek TYMINSKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNER BASED OPTICAL PROXIMITY CORRECTION SYSTEM AND METHOD OF USE
- Publication number 20160161842
- Publication date Jun 9, 2016
- Nikon Corporation
- Jacek TYMINSKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IN-SITU SCANNER EXPOSURE MONITOR
- Publication number 20130339910
- Publication date Dec 19, 2013
- Nikon Precision Inc.
- Jacek K. TYMINSKI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SCANNER BASED OPTICAL PROXIMITY CORRECTION SYSTEM AND METHOD OF USE
- Publication number 20130191794
- Publication date Jul 25, 2013
- Nikon Precision Inc.
- Jacek TYMINSKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IN-SITU SCANNER EXPOSURE MONITOR
- Publication number 20120331427
- Publication date Dec 27, 2012
- Nikon Precision Inc.
- Jacek K. TYMINSKI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Scanner Based Optical Proximity Correction System and Method of Use
- Publication number 20100058263
- Publication date Mar 4, 2010
- Nikon Precision Inc.
- Jacek Tyminski
- G06 - COMPUTING CALCULATING COUNTING

Raluca POPESCU

Person

Patents Grantslast 30 patents

Scanner based optical proximity correction system and method of use

Scanner based optical proximity correction system and method of use

Predicting pattern critical dimensions in a lithographic exposure p...

Scanner based optical proximity correction system and method of use

Predicting pattern critical dimensions in a lithographic exposure p...

Scanner based optical proximity correction system and method of use

Patents Applicationslast 30 patents

SCANNER BASED OPTICAL PROXIMITY CORRECTION SYSTEM AND METHOD OF USE

SCANNER BASED OPTICAL PROXIMITY CORRECTION SYSTEM AND METHOD OF USE

SCANNER BASED OPTICAL PROXIMITY CORRECTION SYSTEM AND METHOD OF USE

IN-SITU SCANNER EXPOSURE MONITOR

SCANNER BASED OPTICAL PROXIMITY CORRECTION SYSTEM AND METHOD OF USE

IN-SITU SCANNER EXPOSURE MONITOR

Scanner Based Optical Proximity Correction System and Method of Use