Rama R. Goruganthu

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
High performance evaporation-condensation thermal spreading chamber...
- Patent number 10,224,264
- Issue date Mar 5, 2019
- QUALCOMM Incorporated
- Ali Akbar Merrikh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal detector array configured to detect thermal radiation from...
- Patent number 10,168,222
- Issue date Jan 1, 2019
- QUALCOMM Incorporated
- Rama Rao Goruganthu
- G01 - MEASURING TESTING
Information Patent Grant
Visible laser circuit fault isolation
- Patent number 10,132,861
- Issue date Nov 20, 2018
- QUALCOMM Incorporated
- Rama Rao Goruganthu
- G01 - MEASURING TESTING
Information Patent Grant
Laser scanning module including an optical isolator
- Patent number 9,304,308
- Issue date Apr 5, 2016
- Advanced Micro Devices, Inc.
- Rama R. Goruganthu
- G01 - MEASURING TESTING
Information Patent Grant
Wide area soft defect localization
- Patent number 8,558,565
- Issue date Oct 15, 2013
- Advanced Micro Devices, Inc.
- Abdullah M. Yassine
- G01 - MEASURING TESTING
Information Patent Grant
Optical isolation module and method for utilizing the same
- Patent number 8,537,464
- Issue date Sep 17, 2013
- Advanced Micro Devices, Inc.
- Rama R. Goruganthu
- G01 - MEASURING TESTING
Information Patent Grant
Silicon photon detector
- Patent number 8,232,586
- Issue date Jul 31, 2012
- GlobalFoundries Inc.
- Ronald M. Potok
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid immersion lens lithography
- Patent number 8,187,772
- Issue date May 29, 2012
- GLOBALFOUNDRIES Inc.
- Rama R. Goruganthu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Wide area soft defect localization
- Patent number 7,884,633
- Issue date Feb 8, 2011
- Advanced Micro Devices, Inc.
- Ronald M. Potok
- G01 - MEASURING TESTING
Information Patent Grant
Thermally conductive integrated circuit mounting structures
- Patent number 7,272,010
- Issue date Sep 18, 2007
- Advanced Micro Devices, Inc.
- Miguel Santana, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical probing of SOI circuits
- Patent number 7,235,800
- Issue date Jun 26, 2007
- Advanced Micro Devices, Inc.
- Rama R. Goruganthu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor die analysis as a function of optical reflections fro...
- Patent number 7,196,800
- Issue date Mar 27, 2007
- Advanced Micro Devices, Inc.
- Jeffrey D. Birdsley
- G01 - MEASURING TESTING
Information Patent Grant
Thermally conductive integrated circuit mounting structures
- Patent number 6,994,584
- Issue date Feb 7, 2006
- Advanced Micro Devices, Inc.
- Miguel Santana, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual-differential interferometry for silicon device damage detection
- Patent number 6,992,773
- Issue date Jan 31, 2006
- Advanced Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Circuit analysis and manufacture using electric field-induced effects
- Patent number 6,894,518
- Issue date May 17, 2005
- Advanced Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Circuit analysis using electric field-induced effects
- Patent number 6,891,390
- Issue date May 10, 2005
- Advanced Micro Devices
- Rama R. Goruganthu
- G01 - MEASURING TESTING
Information Patent Grant
Localized heating for defect isolation during die operation
- Patent number 6,873,166
- Issue date Mar 29, 2005
- Advance Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
High resolution heat exchange
- Patent number 6,836,132
- Issue date Dec 28, 2004
- Advance Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Photon beacon
- Patent number 6,833,718
- Issue date Dec 21, 2004
- Advanced Micro Devices, Inc.
- David Bethke
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical analysis of integrated circuits
- Patent number 6,833,716
- Issue date Dec 21, 2004
- Advanced Micro Devices, Inc.
- Rama R. Goruganthu
- G01 - MEASURING TESTING
Information Patent Grant
Photon detection enhancement of superconducting hot-electron photod...
- Patent number 6,828,809
- Issue date Dec 7, 2004
- Advanced Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Substrate removal as a function of emitted photons at the back side...
- Patent number 6,806,166
- Issue date Oct 19, 2004
- Advanced Micro Devices, Inc.
- Jeffrey D. Birdsley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanotube tip for atomic force microscope
- Patent number 6,780,664
- Issue date Aug 24, 2004
- Advanced Micro Devices, Inc.
- Rama R. Goruganthu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor structure having backside probe points for direct sig...
- Patent number 6,720,641
- Issue date Apr 13, 2004
- Advanced Micro Devices, Inc.
- Jeffrey David Birdsley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical analysis for SOI integrated circuits
- Patent number 6,716,683
- Issue date Apr 6, 2004
- Advanced Mircor Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
De broglie microscope
- Patent number 6,714,294
- Issue date Mar 30, 2004
- Advanced Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement and method for providing an imaging path using a silico...
- Patent number 6,709,985
- Issue date Mar 23, 2004
- Advanced Micro Devices, Inc.
- Rama R. Goruganthu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect detection in semiconductor devices
- Patent number 6,686,757
- Issue date Feb 3, 2004
- Advanced Micro Devices, Inc.
- Rosalinda M. Ring
- G01 - MEASURING TESTING
Information Patent Grant
Picosecond imaging circuit analysis probe and system
- Patent number 6,657,446
- Issue date Dec 2, 2003
- Advanced Micro Devices, Inc.
- Rama R. Goruganthu
- G01 - MEASURING TESTING
Information Patent Grant
IC analysis involving logic state mapping in a SOI die
- Patent number 6,653,849
- Issue date Nov 25, 2003
- Advanced Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THERMAL DETECTOR ARRAY CONFIGURED TO DETECT THERMAL RADIATION FROM...
- Publication number 20180283959
- Publication date Oct 4, 2018
- QUALCOMM Incorporated
- Rama Rao GORUGANTHU
- G01 - MEASURING TESTING
Information Patent Application
VISIBLE LASER CIRCUIT FAULT ISOLATION
- Publication number 20180080983
- Publication date Mar 22, 2018
- QUALCOMM Incorporated
- Rama Rao Goruganthu
- G01 - MEASURING TESTING
Information Patent Application
Laser Scanning Module Including an Optical Isolator
- Publication number 20120320455
- Publication date Dec 20, 2012
- Advanced Micro Devices, Inc.
- Rama R. Goruganthu
- G02 - OPTICS
Information Patent Application
WIDE AREA SOFT DEFECT LOCALIZATION
- Publication number 20120206158
- Publication date Aug 16, 2012
- Abdullah M. Yassine
- G01 - MEASURING TESTING
Information Patent Application
Optical isolation module and method for utilizing the same
- Publication number 20110134520
- Publication date Jun 9, 2011
- Advanced Micro Devices, Inc.
- Rama R. Goruganthu
- G02 - OPTICS
Information Patent Application
Silicon Photon Detector
- Publication number 20110037107
- Publication date Feb 17, 2011
- Ronald M. Potok
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wide Area Soft Defect Localization
- Publication number 20090302880
- Publication date Dec 10, 2009
- Ronald M. Potok
- G01 - MEASURING TESTING
Information Patent Application
Solid immersion lens lithography
- Publication number 20060078637
- Publication date Apr 13, 2006
- Rama R. Goruganthu
- B82 - NANO-TECHNOLOGY

Rama R. Goruganthu

Person

Patents Grantslast 30 patents

High performance evaporation-condensation thermal spreading chamber...

Thermal detector array configured to detect thermal radiation from...

Visible laser circuit fault isolation

Laser scanning module including an optical isolator

Wide area soft defect localization

Optical isolation module and method for utilizing the same

Silicon photon detector

Solid immersion lens lithography

Wide area soft defect localization

Thermally conductive integrated circuit mounting structures

Electrical probing of SOI circuits

Semiconductor die analysis as a function of optical reflections fro...

Thermally conductive integrated circuit mounting structures

Dual-differential interferometry for silicon device damage detection

Circuit analysis and manufacture using electric field-induced effects

Circuit analysis using electric field-induced effects

Localized heating for defect isolation during die operation

High resolution heat exchange

Photon beacon

Electro-optical analysis of integrated circuits

Photon detection enhancement of superconducting hot-electron photod...

Substrate removal as a function of emitted photons at the back side...

Nanotube tip for atomic force microscope

Semiconductor structure having backside probe points for direct sig...

Optical analysis for SOI integrated circuits

De broglie microscope

Arrangement and method for providing an imaging path using a silico...

Defect detection in semiconductor devices

Picosecond imaging circuit analysis probe and system

IC analysis involving logic state mapping in a SOI die

Patents Applicationslast 30 patents

THERMAL DETECTOR ARRAY CONFIGURED TO DETECT THERMAL RADIATION FROM...

VISIBLE LASER CIRCUIT FAULT ISOLATION

Laser Scanning Module Including an Optical Isolator

WIDE AREA SOFT DEFECT LOCALIZATION

Optical isolation module and method for utilizing the same

Silicon Photon Detector

Wide Area Soft Defect Localization

Solid immersion lens lithography