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Ramachandra Katragadda
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Lubbock, TX, US
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last 30 patents
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Patent Grant
Method and system for identifying defects in a semiconductor
Patent number
6,292,582
Issue date
Sep 18, 2001
YouLing Lin
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Apparatus and method for automatic knowlege-based object identifica...
Patent number
6,014,461
Issue date
Jan 11, 2000
Texas Instruments Incorporated
Audrey Kathleen Hennessey
G06 - COMPUTING CALCULATING COUNTING