Ramachandran Krishnaswamy

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Using shared pins in a concurrent test execution environment
- Patent number 9,274,911
- Issue date Mar 1, 2016
- Advantest Corporation
- Mark Elston
- G01 - MEASURING TESTING
Information Patent Grant
Method and structure to develop a test program for semiconductor in...
- Patent number 8,255,198
- Issue date Aug 28, 2012
- Advantest Corporation
- Ramachandran Krishnaswamy
- G01 - MEASURING TESTING
Information Patent Grant
Method and structure to develop a test program for semiconductor in...
- Patent number 7,197,417
- Issue date Mar 27, 2007
- Advantest America R&D Center, Inc.
- Ankan Pramanick
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
USING SHARED PINS IN A CONCURRENT TEST EXECUTION ENVIRONMENT
- Publication number 20140237291
- Publication date Aug 21, 2014
- Advantest Corporation
- Mark Elston
- G01 - MEASURING TESTING
Information Patent Application
Method and Structure to Develop a Test Program for Semiconductor In...
- Publication number 20100192135
- Publication date Jul 29, 2010
- Advantest Corporation
- Ramachandran Krishnaswamy
- G01 - MEASURING TESTING
Information Patent Application
Method and structure to develop a test program for semiconductor in...
- Publication number 20050154551
- Publication date Jul 14, 2005
- Advantest Corporation
- Ankan Pramanick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and structure to develop a test program for semiconductor in...
- Publication number 20040225459
- Publication date Nov 11, 2004
- Advantest Corporation
- Ramachandran Krishnaswamy
- G01 - MEASURING TESTING