Raman K. NURANI

Person

Chennai, IN

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for predicting film thickness using virtual met...
- Patent number 11,989,495
- Issue date May 21, 2024
- Applied Materials, Inc.
- Debkalpo Das
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for predicting film thickness of individual lay...
- Patent number 11,862,520
- Issue date Jan 2, 2024
- Applied Materials, Inc.
- Bharath Ram Sundar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting outliers at a manufacturing system using machine learning
- Patent number 11,842,910
- Issue date Dec 12, 2023
- Applied Materials, Inc.
- Bharath Ram Sundar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Predictive modeling of metrology in semiconductor processes
- Patent number 11,187,992
- Issue date Nov 30, 2021
- Applied Materials, Inc.
- Raman K. Nurani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data management and mining to correlate wafer alignment, design, de...
- Patent number 11,088,039
- Issue date Aug 10, 2021
- Applied Materials, Inc.
- Raman K. Nurani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of predicting areas of vulnerable yield in a semiconductor s...
- Patent number 10,614,262
- Issue date Apr 7, 2020
- Applied Materials, Inc.
- Raman K. Nurani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor process control method
- Patent number 10,579,041
- Issue date Mar 3, 2020
- Applied Materials, Inc.
- Raman K. Nurani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Using design proximity index and effect-to-design proximity ratio t...
- Patent number 10,579,769
- Issue date Mar 3, 2020
- Applied Materials, Inc.
- Raman K. Nurani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data analytics and computational analytics for semiconductor proces...
- Patent number 10,481,199
- Issue date Nov 19, 2019
- Applied Materials, Inc.
- Raman K. Nurani
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INTERACTIVE DATA LABELING FOR SUBSTRATE GENERATION PROCESSES
- Publication number 20250021832
- Publication date Jan 16, 2025
- Applied Materials, Inc.
- Bharath Ram Sundar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR PREDICTING FILM THICKNESS USING VIRTUAL MET...
- Publication number 20240249052
- Publication date Jul 25, 2024
- Applied Materials, Inc.
- Debkalpo Das
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATION AND UTILIZATION OF VIRTUAL FEATURES FOR PROCESS MODELING
- Publication number 20240086597
- Publication date Mar 14, 2024
- Applied Materials, Inc.
- Sundar Narayanan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PIECEWISE FUNCTIONAL FITTING OF SUBSTRATE PROFILES FOR PROCESS LEAR...
- Publication number 20240054333
- Publication date Feb 15, 2024
- Applied Materials, Inc.
- Bharath Ram Sundar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR PREDICTING FILM THICKNESS OF INDIVIDUAL LAY...
- Publication number 20220246481
- Publication date Aug 4, 2022
- Applied Materials, Inc.
- Bharath Ram Sundar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTING OUTLIERS AT A MANUFACTURING SYSTEM USING MACHINE LEARNING
- Publication number 20220246457
- Publication date Aug 4, 2022
- Applied Materials, Inc.
- Bharath Ram Sundar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PREDICTING AREAS OF VULNERABLE YIELD IN A SEMICONDUCTOR S...
- Publication number 20190171786
- Publication date Jun 6, 2019
- APPLIED MATERIALS, INC.
- Raman K. NURANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR PROCESS CONTROL METHOD
- Publication number 20190171181
- Publication date Jun 6, 2019
- Applied Materials, Inc.
- Raman K. NURANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
USING DESIGN PROXIMITY INDEX AND DEFECT-TO-DESIGN PROXIMITY RATIO T...
- Publication number 20190171787
- Publication date Jun 6, 2019
- Applied Materials, Inc.
- Raman K. NURANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA ANALYTICS AND COMPUTATIONAL ANALYTICS FOR SEMICONDUCTOR PROCES...
- Publication number 20190170812
- Publication date Jun 6, 2019
- Applied Materials, Inc.
- Raman K. NURANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA MANAGEMENT AND MINING TO CORRELATE WAFER ALIGNMENT, DESIGN, DE...
- Publication number 20190122944
- Publication date Apr 25, 2019
- Applied Materials, Inc.
- Raman K. NURANI
- G05 - CONTROLLING REGULATING
Information Patent Application
PREDICTIVE MODELING OF METROLOGY IN SEMICONDUCTOR PROCESSES
- Publication number 20190121237
- Publication date Apr 25, 2019
- Applied Materials, Inc.
- Raman K. NURANI
- H01 - BASIC ELECTRIC ELEMENTS

Raman K. NURANI

Person

Patents Grantslast 30 patents

Systems and methods for predicting film thickness using virtual met...

Systems and methods for predicting film thickness of individual lay...

Detecting outliers at a manufacturing system using machine learning

Predictive modeling of metrology in semiconductor processes

Data management and mining to correlate wafer alignment, design, de...

Method of predicting areas of vulnerable yield in a semiconductor s...

Semiconductor process control method

Using design proximity index and effect-to-design proximity ratio t...

Data analytics and computational analytics for semiconductor proces...

Patents Applicationslast 30 patents

INTERACTIVE DATA LABELING FOR SUBSTRATE GENERATION PROCESSES

SYSTEMS AND METHODS FOR PREDICTING FILM THICKNESS USING VIRTUAL MET...

GENERATION AND UTILIZATION OF VIRTUAL FEATURES FOR PROCESS MODELING

PIECEWISE FUNCTIONAL FITTING OF SUBSTRATE PROFILES FOR PROCESS LEAR...

SYSTEMS AND METHODS FOR PREDICTING FILM THICKNESS OF INDIVIDUAL LAY...

DETECTING OUTLIERS AT A MANUFACTURING SYSTEM USING MACHINE LEARNING

METHOD OF PREDICTING AREAS OF VULNERABLE YIELD IN A SEMICONDUCTOR S...

SEMICONDUCTOR PROCESS CONTROL METHOD

USING DESIGN PROXIMITY INDEX AND DEFECT-TO-DESIGN PROXIMITY RATIO T...

DATA ANALYTICS AND COMPUTATIONAL ANALYTICS FOR SEMICONDUCTOR PROCES...

DATA MANAGEMENT AND MINING TO CORRELATE WAFER ALIGNMENT, DESIGN, DE...

PREDICTIVE MODELING OF METROLOGY IN SEMICONDUCTOR PROCESSES