Ramana Tadepalli

Person

McKinney, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
RDSON/dRON measurement method and circuit for high voltage HEMTs
- Patent number 11,448,686
- Issue date Sep 20, 2022
- Texas Instruments Incorporated
- Ramana Tadepalli
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a high voltage transistor with a field plate
- Patent number 11,302,785
- Issue date Apr 12, 2022
- Texas Instruments Incorporated
- Ramana Tadepalli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing solid state devices before completing manufacture
- Patent number 10,784,172
- Issue date Sep 22, 2020
- Texas Instruments Incorporated
- Cody Michael Berger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic test equipment (ATE) platform translation
- Patent number 10,481,206
- Issue date Nov 19, 2019
- Texas Instruments Incorporated
- Ramana Tadepalli
- G01 - MEASURING TESTING
Information Patent Grant
Spike safe floating current and voltage source
- Patent number 10,317,456
- Issue date Jun 11, 2019
- Texas Instruments Incorporated
- Ramana Tadepalli
- G01 - MEASURING TESTING
Information Patent Grant
I/O control circuit for reduced pin count (RPC) device testing
- Patent number 10,012,690
- Issue date Jul 3, 2018
- Texas Instruments Incorporated
- Ramana Tadepalli
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in socket for packaged integrated circuits
- Patent number 9,837,747
- Issue date Dec 5, 2017
- Texas Instruments Incorporated
- Ramana Tadepalli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
I/O control circuit for reduced pin count (RPC) device testing
- Patent number 9,817,064
- Issue date Nov 14, 2017
- Texas Instruments Incorporated
- Ramana Tadepalli
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH VOLTAGE TRANSISTOR WITH A FIELD PLATE
- Publication number 20220216309
- Publication date Jul 7, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Ramana Tadepalli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RDSON/dRON MEASUREMENT METHOD AND CIRCUIT FOR HIGH VOLTAGE HEMTS
- Publication number 20210080498
- Publication date Mar 18, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Ramana Tadepalli
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A HIGH VOLTAGE TRANSISTOR WITH A FIELD PLATE
- Publication number 20200403071
- Publication date Dec 24, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Ramana Tadepalli
- G01 - MEASURING TESTING
Information Patent Application
TESTING SOLID STATE DEVICES BEFORE COMPLETING MANUFACTURE
- Publication number 20190206746
- Publication date Jul 4, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Cody Michael BERGER
- G01 - MEASURING TESTING
Information Patent Application
I/O CONTROL CIRCUIT FOR REDUCED PIN COUNT (RPC) DEVICE TESTING
- Publication number 20180143241
- Publication date May 24, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Ramana Tadepalli
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT (ATE) PLATFORM TRANSLATION
- Publication number 20180067161
- Publication date Mar 8, 2018
- TEXAS INSTRUMENTS INCORPORATED
- RAMANA TADEPALLI
- G01 - MEASURING TESTING
Information Patent Application
I/O CONTROL CIRCUIT FOR REDUCED PIN COUNT (RPC) DEVICE TESTING
- Publication number 20170307681
- Publication date Oct 26, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Ramana Tadepalli
- G01 - MEASURING TESTING
Information Patent Application
BURN-IN SOCKET FOR PACKAGED INTEGRATED CIRCUITS
- Publication number 20170279211
- Publication date Sep 28, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Ramana Tadepalli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPIKE SAFE FLOATING CURRENT AND VOLTAGE SOURCE
- Publication number 20170276724
- Publication date Sep 28, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Ramana Tadepalli
- G01 - MEASURING TESTING

Ramana Tadepalli

Person

Patents Grantslast 30 patents

RDSON/dRON measurement method and circuit for high voltage HEMTs

Method for testing a high voltage transistor with a field plate

Testing solid state devices before completing manufacture

Automatic test equipment (ATE) platform translation

Spike safe floating current and voltage source

I/O control circuit for reduced pin count (RPC) device testing

Burn-in socket for packaged integrated circuits

I/O control circuit for reduced pin count (RPC) device testing

Patents Applicationslast 30 patents

HIGH VOLTAGE TRANSISTOR WITH A FIELD PLATE

RDSON/dRON MEASUREMENT METHOD AND CIRCUIT FOR HIGH VOLTAGE HEMTS

METHOD FOR TESTING A HIGH VOLTAGE TRANSISTOR WITH A FIELD PLATE

TESTING SOLID STATE DEVICES BEFORE COMPLETING MANUFACTURE

I/O CONTROL CIRCUIT FOR REDUCED PIN COUNT (RPC) DEVICE TESTING

AUTOMATIC TEST EQUIPMENT (ATE) PLATFORM TRANSLATION

I/O CONTROL CIRCUIT FOR REDUCED PIN COUNT (RPC) DEVICE TESTING

BURN-IN SOCKET FOR PACKAGED INTEGRATED CIRCUITS

SPIKE SAFE FLOATING CURRENT AND VOLTAGE SOURCE