Rami Elichai

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Ashqelon, IL

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Patents Grantslast 30 patents

Information Patent Grant
Integrated system and method
- Patent number 11,294,164
- Issue date Apr 5, 2022
- Applied Materials Israel Ltd.
- Igor Krivts (Krayvitz)
- G02 - OPTICS
Information Patent Grant
Scanning system and method for scanning an object
- Patent number 9,958,670
- Issue date May 1, 2018
- Applied Materials Israel Ltd.
- Ron Naftail
- G02 - OPTICS
Information Patent Grant
Methods and apparatus for inspecting a plurality of dies
- Patent number 7,847,929
- Issue date Dec 7, 2010
- Applied Materials Israel, Ltd.
- Tuvia Dror Kutscher
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for line alignment to compensate for static...
- Patent number 6,831,736
- Issue date Dec 14, 2004
- Applied Materials Israel, Ltd.
- Rami Elichai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED SYSTEM AND METHOD
- Publication number 20210026123
- Publication date Jan 28, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Igor Krivts (Krayvitz)
- G02 - OPTICS
Information Patent Application
SCANNING SYSTEM AND METHOD FOR SCANNING AN OBJECT
- Publication number 20180081166
- Publication date Mar 22, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Ron Naftail
- G02 - OPTICS
Information Patent Application
Die Column Registration
- Publication number 20080259326
- Publication date Oct 23, 2008
- Tuvia Dror Kutscher
- G01 - MEASURING TESTING
Information Patent Application
Method of and apparatus for line alignment to compensate for static...
- Publication number 20040066506
- Publication date Apr 8, 2004
- Applied Materials Israel Ltd.
- Rami Elichai
- G01 - MEASURING TESTING