Ran BADANES

Follow

Person

Rishon Le-Zion, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Machine learning-based defect detection of a specimen
- Patent number 11,449,711
- Issue date Sep 20, 2022
- Applied Materials Isreal Ltd
- Ran Badanes
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MACHINE LEARNING BASED DEFECT EXAMINATION FOR SEMICONDUCTOR SPECIMENS
- Publication number 20240428396
- Publication date Dec 26, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Boris SHERMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING BASED DEFECT EXAMINATION FOR SEMICONDUCTOR SPECIMENS
- Publication number 20240338811
- Publication date Oct 10, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehonatan Hai OFIR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT EXAMINATION ON A SEMICONDUCTOR SPECIMEN
- Publication number 20240078659
- Publication date Mar 7, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehonatan Hai OFIR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING-BASED DEFECT DETECTION OF A SPECIMEN
- Publication number 20210209418
- Publication date Jul 8, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Ran BADANES
- G06 - COMPUTING CALCULATING COUNTING