Ran GOLDMAN

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Hod Hasharon, IL

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Patents Grantslast 30 patents

Information Patent Grant
Technique for measuring overlay between layers of a multilayer stru...
- Patent number 10,354,376
- Issue date Jul 16, 2019
- Applied Materials Israel Ltd.
- Yakov Weinberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Technique for measuring overlay between layers of a multilayer stru...
- Patent number 9,916,652
- Issue date Mar 13, 2018
- Applied Materials Israel Ltd.
- Yakov Weinberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
CD-SEM technique for wafers fabrication control
- Patent number 9,824,852
- Issue date Nov 21, 2017
- Applied Materials Israel Ltd.
- Roman Kris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Technique for measuring overlay between layers of a multilayer stru...
- Patent number 9,530,199
- Issue date Dec 27, 2016
- Applied Materials Israel Ltd.
- Yakov Weinberg
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...
- Publication number 20180268539
- Publication date Sep 20, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Yakov WEINBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...
- Publication number 20170243343
- Publication date Aug 24, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Yakov WEINBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CD-SEM TECHNIQUE FOR WAFERS FABRICATION CONTROL
- Publication number 20170194125
- Publication date Jul 6, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Roman KRIS
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...
- Publication number 20170018066
- Publication date Jan 19, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Yakov WEINBERG
- G06 - COMPUTING CALCULATING COUNTING