Ran SCHLEYEN

Person

Rehovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Detecting defects in semiconductor specimens using weak labeling
- Patent number 11,790,515
- Issue date Oct 17, 2023
- Applied Materials Israel Ltd.
- Irad Peleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine learning-based defect detection of a specimen
- Patent number 11,449,711
- Issue date Sep 20, 2022
- Applied Materials Isreal Ltd
- Ran Badanes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting defects in semiconductor specimens using weak labeling
- Patent number 11,379,972
- Issue date Jul 5, 2022
- Applied Materials Israel Ltd.
- Irad Peleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic selection of algorithmic modules for examination of a spe...
- Patent number 11,151,710
- Issue date Oct 19, 2021
- Applied Materials Israel Ltd.
- Ran Schleyen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging an area that includes an upper surface and a hole
- Patent number 10,340,116
- Issue date Jul 2, 2019
- Applied Materials Israel Ltd.
- Ran Schleyen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spectral imaging method and system
- Patent number 10,101,206
- Issue date Oct 16, 2018
- RAMOT AT TEL-AVI UNIVERSITY LTD.
- Ran Schleyen
- G01 - MEASURING TESTING
Information Patent Grant
System and method for light-field imaging
- Patent number 9,900,562
- Issue date Feb 20, 2018
- Ramot at Tel Aviv University Ltd.
- David Mendlovic
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
DETECTING DEFECTS IN SEMICONDUCTOR SPECIMENS USING WEAK LABELING
- Publication number 20220301151
- Publication date Sep 22, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Irad PELEG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTING DEFECTS IN SEMICONDUCTOR SPECIMENS USING WEAK LABELING
- Publication number 20210383530
- Publication date Dec 9, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Irad PELEG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC SELECTION OF ALGORITHMIC MODULES FOR EXAMINATION OF A SPE...
- Publication number 20210343000
- Publication date Nov 4, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Ran SCHLEYEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING-BASED DEFECT DETECTION OF A SPECIMEN
- Publication number 20210209418
- Publication date Jul 8, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Ran BADANES
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTRAL IMAGING METHOD AND SYSTEM
- Publication number 20180252583
- Publication date Sep 6, 2018
- Ramot at Tel Aviv University Ltd.
- Ran SCHLEYEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR LIGHT-FIELD lMAGING
- Publication number 20170201727
- Publication date Jul 13, 2017
- RAMOT AT TEL-AVIV UNlVERSITY LTD.
- David MENDLOVIC
- G02 - OPTICS

Ran SCHLEYEN

Person

Patents Grantslast 30 patents

Detecting defects in semiconductor specimens using weak labeling

Machine learning-based defect detection of a specimen

Detecting defects in semiconductor specimens using weak labeling

Automatic selection of algorithmic modules for examination of a spe...

Imaging an area that includes an upper surface and a hole

Spectral imaging method and system

System and method for light-field imaging

Patents Applicationslast 30 patents

DETECTING DEFECTS IN SEMICONDUCTOR SPECIMENS USING WEAK LABELING

DETECTING DEFECTS IN SEMICONDUCTOR SPECIMENS USING WEAK LABELING

AUTOMATIC SELECTION OF ALGORITHMIC MODULES FOR EXAMINATION OF A SPE...

MACHINE LEARNING-BASED DEFECT DETECTION OF A SPECIMEN

SPECTRAL IMAGING METHOD AND SYSTEM

SYSTEM AND METHOD FOR LIGHT-FIELD lMAGING