Ran YACOBY

Person

Rehovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for controlling measurements of sample's parameters
- Patent number 11,874,606
- Issue date Jan 16, 2024
- Nova Ltd.
- Barak Bringoltz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Machine and deep learning methods for spectra-based metrology and p...
- Patent number 11,815,819
- Issue date Nov 14, 2023
- Nova Ltd.
- Barak Bringoltz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
MACHINE LEARNING BASED DEFECT EXAMINATION FOR SEMICONDUCTOR SPECIMENS
- Publication number 20240428396
- Publication date Dec 26, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Boris SHERMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE AND DEEP LEARNING METHODS FOR SPECTRA-BASED METROLOGY AND P...
- Publication number 20240310737
- Publication date Sep 19, 2024
- NOVA LTD
- Barak BRINGOLTZ
- G05 - CONTROLLING REGULATING
Information Patent Application
OPTIMAL DETERMINATION OF AN OVERLAY TARGET USING MACHINE LEARNING
- Publication number 20240289940
- Publication date Aug 29, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Bar DUBOVSKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING BASED YIELD PREDICTION
- Publication number 20240281958
- Publication date Aug 22, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Boris LEVANT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE AUGMENTATION FOR MACHINE LEARNING BASED DEFECT EXAMINATION
- Publication number 20240095903
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Boris SHERMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for controlling measurements of sample's parameters
- Publication number 20230185203
- Publication date Jun 15, 2023
- NOVA LTD
- Barak BRINGOLTZ
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MACHINE AND DEEP LEARNING METHODS FOR SPECTRA-BASED METROLOGY AND P...
- Publication number 20230124431
- Publication date Apr 20, 2023
- NOVA LTD
- Barak BRINGOLTZ
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Person

Patents Grantslast 30 patents

System and method for controlling measurements of sample's parameters

Machine and deep learning methods for spectra-based metrology and p...

Patents Applicationslast 30 patents

MACHINE LEARNING BASED DEFECT EXAMINATION FOR SEMICONDUCTOR SPECIMENS

MACHINE AND DEEP LEARNING METHODS FOR SPECTRA-BASED METROLOGY AND P...

OPTIMAL DETERMINATION OF AN OVERLAY TARGET USING MACHINE LEARNING

MACHINE LEARNING BASED YIELD PREDICTION

IMAGE AUGMENTATION FOR MACHINE LEARNING BASED DEFECT EXAMINATION

System and method for controlling measurements of sample's parameters

MACHINE AND DEEP LEARNING METHODS FOR SPECTRA-BASED METROLOGY AND P...