Rance M. Fortenberry

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for accommodating for wavelength drift of opti...
- Patent number 6,496,296
- Issue date Dec 17, 2002
- Agilent Technologies, Inc.
- Rance M Fortenberry
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wavelength meter adapted for averaging multiple measurements
- Patent number 6,462,823
- Issue date Oct 8, 2002
- Agilent Technologies, Inc.
- David M. Braun
- G01 - MEASURING TESTING
Information Patent Grant
Chromatic dispersion measurement scheme for optical systems having...
- Patent number 6,313,934
- Issue date Nov 6, 2001
- Agilent Technologies, Inc.
- Rance M Fortenberry
- G01 - MEASURING TESTING
Information Patent Grant
Chromatic dispersion measurement scheme having high frequency resol...
- Patent number 6,088,088
- Issue date Jul 11, 2000
- Hewlett-Packard Company
- Rance M. Fortenberry
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for characterizing short optical pulses
- Patent number 5,684,586
- Issue date Nov 4, 1997
- Hewlett-Packard Company
- Rance M. Fortenberry
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAVELENGTH METER ADAPTED FOR AVERAGING MULTIPLE MEASUREMENTS
- Publication number 20020149776
- Publication date Oct 17, 2002
- David M. Braun
- G01 - MEASURING TESTING