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Randall C. Gray
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Tempe, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device and method therefor
Patent number
10,785,064
Issue date
Sep 22, 2020
Semiconductor Components Industries, LLC
Tai-Hua Chen
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Methods for switch health determination
Patent number
10,649,033
Issue date
May 12, 2020
NXP USA, INC.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Grant
Wetting current diagnostics
Patent number
10,641,827
Issue date
May 5, 2020
NXP USA, INC.
William E. Edwards
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Wetting current diagnostics
Patent number
10,101,395
Issue date
Oct 16, 2018
NXP USA, INC.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for switch health determination
Patent number
9,778,319
Issue date
Oct 3, 2017
NXP USA, INC.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for monitoring operation of an insulated gate...
Patent number
9,664,729
Issue date
May 30, 2017
NXP USA, INC.
Randall C. Gray
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Antifuse with bypass diode and method thereof
Patent number
9,552,890
Issue date
Jan 24, 2017
NXP USA, INC.
John M. Pigott
G11 - INFORMATION STORAGE
Information
Patent Grant
Die-to-die inductive communication devices and methods
Patent number
9,466,413
Issue date
Oct 11, 2016
FREESCALE SEMICONDUCTOR, INC.
Fred T. Brauchler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Deep trench isolation structure layout and method of forming
Patent number
9,385,190
Issue date
Jul 5, 2016
FREESCALE SEMICONDUCTOR, INC.
John M. Pigott
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of manufacturing and operating die-to-die inductive communi...
Patent number
9,362,987
Issue date
Jun 7, 2016
FREESCALE SEMICONDUCTOR, INC.
Fred T. Brauchler
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Power switching device, three phase bridge inverter, and method of...
Patent number
9,356,515
Issue date
May 31, 2016
FREESCALE SEMICONDUCTOR, INC.
Thierry Sicard
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Switch detection device and method of use
Patent number
9,329,237
Issue date
May 3, 2016
FREESCALE SEMICONDUCTOR, INC.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Grant
Wafer-level gate stress testing
Patent number
9,322,870
Issue date
Apr 26, 2016
FREESCALE SEMICONDUCTOR, INC.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Grant
Variable reluctance sensor interface with integration based arming...
Patent number
9,285,244
Issue date
Mar 15, 2016
FREESCALE SEMICONDUCTOR, INC.
John M. Pigott
G01 - MEASURING TESTING
Information
Patent Grant
Die-to-die inductive communication devices and methods
Patent number
9,160,423
Issue date
Oct 13, 2015
FREESCALE SEMICONDUCTOR, INC.
Fred T. Brauchler
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Squib driver diagnostic circuit and method
Patent number
9,139,155
Issue date
Sep 22, 2015
FREESCALE SEMICONDUCTOR, INC.
William E. Edwards
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Variable reluctance sensor interface with integration based arming...
Patent number
9,103,847
Issue date
Aug 11, 2015
FREESCALE SEMICONDUCTOR, INC.
John M. Pigott
G01 - MEASURING TESTING
Information
Patent Grant
VRS interface with 1/T arming function
Patent number
8,970,209
Issue date
Mar 3, 2015
FREESCALE SEMICONDUCTOR, INC.
John M. Pigott
G01 - MEASURING TESTING
Information
Patent Grant
Method and detector for determining a state of a switch
Patent number
8,278,932
Issue date
Oct 2, 2012
FREESCALE SEMICONDUCTOR, INC.
Bryan Quinones
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Electronic device operable to protect a power transistor when used...
Patent number
7,929,266
Issue date
Apr 19, 2011
FREESCALE SEMICONDUCTOR, INC.
Ibrahim Kandah
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
System and method for reducing current in a device during testing
Patent number
7,538,559
Issue date
May 26, 2009
FREESCALE SEMICONDUCTOR, INC.
Paul T. Bennett
G01 - MEASURING TESTING
Information
Patent Grant
Voltage regulator and method for providing a regulated output
Patent number
7,423,416
Issue date
Sep 9, 2008
FREESCALE SEMICONDUCTOR, INC.
Bryan Quinones
G05 - CONTROLLING REGULATING
Information
Patent Grant
Slew-rate control apparatus and methods for a power transistor to r...
Patent number
7,365,584
Issue date
Apr 29, 2008
FREESCALE SEMICONDUCTOR, INC.
Paul T. Bennett
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Semiconductor device and method for forming the same
Patent number
7,276,419
Issue date
Oct 2, 2007
FREESCALE SEMICONDUCTOR, INC.
Vishnu Khemka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for reducing current in a device during testing
Patent number
7,218,119
Issue date
May 15, 2007
Freescale Semiconductors, Inc.
Paul T. Bennett
G01 - MEASURING TESTING
Information
Patent Grant
Open loop inductor current control system and method
Patent number
6,690,144
Issue date
Feb 10, 2004
Motorola, Inc.
Joseph DeNicholas
G05 - CONTROLLING REGULATING
Information
Patent Grant
High-side, low-side configurable driver
Patent number
6,348,820
Issue date
Feb 19, 2002
Motorola, Inc.
Paul T. Bennett
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Fast acting FET test circuit with current detection for SIR diagnos...
Patent number
5,872,460
Issue date
Feb 16, 1999
Delco Electronics Corp.
Paul T. Bennett
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Current limit controller for an air bag deployment system
Patent number
5,734,317
Issue date
Mar 31, 1998
Motorola, Inc.
Paul T. Bennett
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Circuit and method of reverse voltage protection using a lateral tr...
Patent number
5,604,373
Issue date
Feb 18, 1997
Motorola, Inc.
David M. Susak
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
WETTING CURRENT DIAGNOSTICS
Publication number
20180356466
Publication date
Dec 13, 2018
NXP USA, Inc.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Application
METHODS FOR SWITCH HEALTH DETERMINATION
Publication number
20180031635
Publication date
Feb 1, 2018
NXP USA, Inc.
William E. EDWARDS
G01 - MEASURING TESTING
Information
Patent Application
Wetting Current Diagnostics
Publication number
20160238658
Publication date
Aug 18, 2016
FREESCALE SEMICONDUCTOR, INC.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR SWITCH HEALTH DETERMINATION
Publication number
20160131713
Publication date
May 12, 2016
FREESCALE SEMICONDUCTOR, INC.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF MANUFACTURING AND OPERATING DIE-TO-DIE INDUCTIVE COMMUNI...
Publication number
20150333805
Publication date
Nov 19, 2015
FREESCALE SEMICONDUCTOR, INC.
FRED T. BRAUCHLER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS AND METHOD FOR MONITORING OPERATION OF AN INSULATED GATE...
Publication number
20150316602
Publication date
Nov 5, 2015
FREESCALE SEMICONDUCTOR, INC.
RANDALL C. GRAY
G01 - MEASURING TESTING
Information
Patent Application
VARIABLE RELUCTANCE SENSOR INTERFACE WITH INTEGRATION BASED ARMING...
Publication number
20150260548
Publication date
Sep 17, 2015
FREESCALE SEMICONDUCTOR, INC.
John M. Pigott
G01 - MEASURING TESTING
Information
Patent Application
DEEP TRENCH ISOLATION STRUCTURE LAYOUT AND METHOD THEREOF
Publication number
20150255537
Publication date
Sep 10, 2015
FREESCALE SEMICONDUCTOR, INC.
John M. PIGOTT
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ANTIFUSE WITH BYPASS DIODE AND METHOD THEREOF
Publication number
20150243365
Publication date
Aug 27, 2015
FREESCALE SEMICONDUCTOR, INC.
John M. PIGOTT
G11 - INFORMATION STORAGE
Information
Patent Application
SWITCH DETECTION DEVICE AND METHOD OF USE
Publication number
20150198666
Publication date
Jul 16, 2015
FREESCALE SEMICONDUCTOR, INC.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Application
POWER SWITCHING DEVICE, THREE PHASE BRIDGE INVERTER, AND METHOD OF...
Publication number
20150188426
Publication date
Jul 2, 2015
FREESCALE SEMICONDUCTOR, INC.
Thierry Sicard
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
DIE-TO-DIE INDUCTIVE COMMUNICATION DEVICES AND METHODS
Publication number
20150171934
Publication date
Jun 18, 2015
FRED T. BRAUCHLER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SQUIB DRIVER DIAGNOSTIC CIRCUIT AND METHOD
Publication number
20150075401
Publication date
Mar 19, 2015
FREESCALE SEMICONDUCTOR, INC.
William E. EDWARDS
B60 - VEHICLES IN GENERAL
Information
Patent Application
WAFER-LEVEL GATE STRESS TESTING
Publication number
20150067429
Publication date
Mar 5, 2015
FREESCALE SEMICONDUCTOR, INC.
William E. Edwards
G01 - MEASURING TESTING
Information
Patent Application
DIE-TO-DIE INDUCTIVE COMMUNICATION DEVICES AND METHODS
Publication number
20150004902
Publication date
Jan 1, 2015
John M. PIGOTT
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DIE-TO-DIE INDUCTIVE COMMUNICATION DEVICES AND METHODS
Publication number
20150001948
Publication date
Jan 1, 2015
Fred T. BRAUCHLER
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
VARIABLE RELUCTANCE SENSOR INTERFACE WITH INTEGRATION BASED ARMING...
Publication number
20140035561
Publication date
Feb 6, 2014
FREESCALE SEMICONDUCTOR, INC.
John M. Pigott
G01 - MEASURING TESTING
Information
Patent Application
VRS INTERFACE WITH 1/T ARMING FUNCTION
Publication number
20130328554
Publication date
Dec 12, 2013
FREESCALE SEMICONDUCTOR, INC.
John M. Pigott
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DETECTOR FOR DETERMINING A STATE OF A SWITCH
Publication number
20110115527
Publication date
May 19, 2011
Bryan Quinones
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
ELECTRONIC DEVICE OPERABLE TO PROTECT A POWER TRANSISTOR WHEN USED...
Publication number
20090161287
Publication date
Jun 25, 2009
FREESCALE SEMICONDUCTOR, INC.
Ibrahim Kandah
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SYSTEM AND METHOD FOR REDUCING CURRENT IN A DEVICE DURING TESTING
Publication number
20070279069
Publication date
Dec 6, 2007
FREESCALE SEMICONDUCTOR, INC.
Paul T. Bennett
G01 - MEASURING TESTING
Information
Patent Application
Slew-rate control apparatus and methods for a power transistor to r...
Publication number
20070279106
Publication date
Dec 6, 2007
Paul T. Bennett
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Semiconductor device and method for forming the same
Publication number
20070096225
Publication date
May 3, 2007
Vishnu Khemka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPEN LOOP INDUCTOR CURRENT CONTROL SYSTEM AND METHOD
Publication number
20040027097
Publication date
Feb 12, 2004
MOTOROLA, INC.
Joseph DeNicholas
G05 - CONTROLLING REGULATING