Randall Jaffe

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Clayton, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Dithering mechanism for eliminating zero-rate bias in a gyroscope
- Patent number 7,548,318
- Issue date Jun 16, 2009
- Custom Sensors & Technologies, Inc.
- Igor Leonidovich Tchertkov
- G01 - MEASURING TESTING
Information Patent Grant
Inertial measurement system and method with sensor bias cancellation
- Patent number 7,509,857
- Issue date Mar 31, 2009
- Custom Sensors & Technologies, Inc.
- Ichiro Shirasaka
- G01 - MEASURING TESTING
Information Patent Grant
Indexing dithering mechanism and method
- Patent number 7,505,140
- Issue date Mar 17, 2009
- Custom Sensors & Technologies, Inc.
- Igor Leonidovich Tchertkov
- G01 - MEASURING TESTING
Information Patent Grant
Inertial measurement system and method with bias cancellation
- Patent number 7,481,109
- Issue date Jan 27, 2009
- Custom Sensors & Technologies, Inc.
- Robert H. Moore
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Dithering mechanism for eliminating zero-rate bias in a gyroscope
- Publication number 20080252175
- Publication date Oct 16, 2008
- CUSTOM SENSORS & TECHNOLOGIES, INC.
- Igor Leonidovich Tchertkov
- G01 - MEASURING TESTING
Information Patent Application
Indexing dithering mechanism and method
- Publication number 20080252177
- Publication date Oct 16, 2008
- CUSTOM SENSORS & TECHNOLOGIES, INC.
- Igor Leonidovich Tchertkov
- G01 - MEASURING TESTING
Information Patent Application
Inertial measurement system and method with sensor bias cancellation
- Publication number 20070245800
- Publication date Oct 25, 2007
- Ichiro Shirasaka
- G01 - MEASURING TESTING
Information Patent Application
Inertial measurement system and method with bias cancellation
- Publication number 20070240486
- Publication date Oct 18, 2007
- Robert H. Moore
- G01 - MEASURING TESTING