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Randall S. GEELS
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San Diego, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Optical instrumentation including a spatially variable filter
Patent number
11,099,068
Issue date
Aug 24, 2021
Filmetrics, Inc.
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Grant
Optical spectrometer configuration including spatially variable fil...
Patent number
10,240,981
Issue date
Mar 26, 2019
Filmetrics, Inc.
Matthew F. Ross
G01 - MEASURING TESTING
Information
Patent Grant
Correction of second-order diffraction effects in fiber-optic-based...
Patent number
8,908,177
Issue date
Dec 9, 2014
Filmetrics, Inc.
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Grant
Thin-film metrology using spectral reflectance with an intermediate...
Patent number
7,502,119
Issue date
Mar 10, 2009
Filmetrics, Inc.
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Grant
Determining wafer orientation in spectral imaging
Patent number
7,151,609
Issue date
Dec 19, 2006
Filmetrics, Inc.
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for high-speed thickness mapping of patterned...
Patent number
7,095,511
Issue date
Aug 22, 2006
Filmetrics, Inc.
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer configured to provide simultaneous multiple intensity...
Patent number
6,184,985
Issue date
Feb 6, 2001
Filmetrics, Inc.
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Grant
Rapid and accurate end point detection in a noisy environment
Patent number
6,172,756
Issue date
Jan 9, 2001
Filmetrics, Inc.
Scott A. Chalmers
B24 - GRINDING POLISHING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL PROFILOMETER
Publication number
20180252518
Publication date
Sep 6, 2018
Scott A. CHALMERS
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL PROFILOMETER
Publication number
20170314914
Publication date
Nov 2, 2017
Scott A. CHALMERS
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL PROFILOMETER
Publication number
20170254641
Publication date
Sep 7, 2017
Scott A. CHALMERS
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SPECTROMETER CONFIGURATION INCLUDING SPATIALLY VARIABLE FIL...
Publication number
20170160134
Publication date
Jun 8, 2017
Matthew F. ROSS
G01 - MEASURING TESTING
Information
Patent Application
CORRECTION OF SECOND-ORDER DIFFRACTION EFFECTS IN FIBER-OPTIC-BASED...
Publication number
20130258333
Publication date
Oct 3, 2013
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Application
Thin-film metrology using spectral reflectance with an intermediate...
Publication number
20080180684
Publication date
Jul 31, 2008
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Application
Determining wafer orientation in spectral imaging
Publication number
20060164657
Publication date
Jul 27, 2006
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Application
Spectral imaging of substrates
Publication number
20060166608
Publication date
Jul 27, 2006
Scott A. Chalmers
B24 - GRINDING POLISHING
Information
Patent Application
Method and apparatus for high-speed thickness mapping of patterned...
Publication number
20050174583
Publication date
Aug 11, 2005
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for high-speed thickness mapping of patterned...
Publication number
20050174584
Publication date
Aug 11, 2005
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Application
Whole-substrate spectral imaging system for CMP
Publication number
20040259472
Publication date
Dec 23, 2004
Scott A. Chalmers
B24 - GRINDING POLISHING
Information
Patent Application
Method and apparatus for high-speed thickness mapping of patterned...
Publication number
20020030826
Publication date
Mar 14, 2002
Scott A. Chalmers
G01 - MEASURING TESTING