Randy Neaman Siade

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Chandler, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of automatically carrying IC-chips, on a planar array of vac...
- Patent number 7,355,386
- Issue date Apr 8, 2008
- Delta Design, Inc.
- Randy Neaman Siade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for testing one or more groups of IC-chips while concurrentl...
- Patent number 6,924,636
- Issue date Aug 2, 2005
- Unisys Corporation
- Randy Neaman Siade
- G01 - MEASURING TESTING
Information Patent Grant
System for testing a group of IC-chips having a chip holding subass...
- Patent number 6,919,718
- Issue date Jul 19, 2005
- Unisys Corporation
- Randy Neaman Siade
- G01 - MEASURING TESTING
Information Patent Grant
System for testing multiple groups of IC-chips which concurrently s...
- Patent number 6,909,299
- Issue date Jun 21, 2005
- Unisys Corporation
- Randy Neaman Siade
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of automatically carrying IC-chips, on a planar array of vac...
- Publication number 20070115015
- Publication date May 24, 2007
- UNISYS CORPORATION
- Randy Neaman Siade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR TESTING ONE OR MORE GROUPS OF IC-CHIPS WHILE CONCURRENTL...
- Publication number 20050099174
- Publication date May 12, 2005
- UNISYS CORPORATION
- Randy Neaman Siade
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING A GROUP OF IC-CHIPS HAVING A CHIP HOLDING SUBASS...
- Publication number 20050099173
- Publication date May 12, 2005
- UNISYS CORPORATION
- Randy Neaman Siade
- G01 - MEASURING TESTING