Randy Yim

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Pleasanten, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of using a test reticle to optimize alignment of integrated...
- Patent number 5,898,478
- Issue date Apr 27, 1999
- LSI Logic Corporation
- Randy Yim
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Integrated circuit test reticle and alignment mark optimization method
- Patent number 5,627,624
- Issue date May 6, 1997
- LSI Logic Corporation
- Randy Yim
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Integrated circuit test reticle and alignment mark optimization method
- Patent number 5,329,334
- Issue date Jul 12, 1994
- LSI Logic Corporation
- Randy Yim
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY