Raphael Ben-Tulila

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Kiryat-Gat, IL

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Patents Grantslast 30 patents

Information Patent Grant
System and method for inspecting patterned devices having microscop...
- Patent number 7,391,510
- Issue date Jun 24, 2008
- Orbotech Ltd.
- Raphael Ben-Tulila
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and method for inspecting patterned devices having microscop...
- Publication number 20070171404
- Publication date Jul 26, 2007
- ORBOTECH LTD.
- Raphael Ben-Tulila
- G01 - MEASURING TESTING