Raphael P. Robertazzi

Person

Ossining, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for the characterization and monitoring of integrated circuits
- Patent number 11,169,200
- Issue date Nov 9, 2021
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Grant
Detection of performance degradation in integrated circuits
- Patent number 11,105,856
- Issue date Aug 31, 2021
- International Business Machines Corporation
- Emily A. Ray
- G01 - MEASURING TESTING
Information Patent Grant
Method for the characterization and monitoring of integrated circuits
- Patent number 11,061,063
- Issue date Jul 13, 2021
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive analysis to determine use history of processor
- Patent number 10,552,278
- Issue date Feb 4, 2020
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Remote monitoring of software
- Patent number 10,491,610
- Issue date Nov 26, 2019
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for the characterization and monitoring of integrated circuits
- Patent number 10,429,433
- Issue date Oct 1, 2019
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Grant
Method for the characterization and monitoring of integrated circuits
- Patent number 10,379,152
- Issue date Aug 13, 2019
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive analysis to determine use history of processor
- Patent number 10,102,090
- Issue date Oct 16, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for testing through silicon vias in 3D integrated circuits
- Patent number 9,784,790
- Issue date Oct 10, 2017
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing through silicon vias in 3D integrated circuits
- Patent number 9,588,174
- Issue date Mar 7, 2017
- International Business Machines Corporation
- Raphael Peter Robertazzi
- G01 - MEASURING TESTING
Information Patent Grant
Method for the characterization and monitoring of integrated circuits
- Patent number 9,568,540
- Issue date Feb 14, 2017
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional (3D) stacked integrated circuit testing
- Patent number 8,542,030
- Issue date Sep 24, 2013
- International Business Machines Corporation
- Chen-Yong Cher
- G01 - MEASURING TESTING
Information Patent Grant
Device for probe card power bus voltage drop reduction
- Patent number 7,408,373
- Issue date Aug 5, 2008
- International Business Machines Corporation
- Raphael Peter Robertazzi
- G01 - MEASURING TESTING
Information Patent Grant
Device for probe card power bus voltage drop reduction
- Patent number 7,187,194
- Issue date Mar 6, 2007
- International Business Machines Corporation
- Raphael Peter Robertazzi
- G01 - MEASURING TESTING
Information Patent Grant
Device for probe card power bus noise reduction
- Patent number 7,005,879
- Issue date Feb 28, 2006
- International Business Machines Corporation
- Raphael Peter Robertazzi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETECTION OF PERFORMANCE DEGRADATION IN INTEGRATED CIRCUITS
- Publication number 20200150181
- Publication date May 14, 2020
- International Business Machines Corporation
- Emily A. Ray
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS
- Publication number 20190353695
- Publication date Nov 21, 2019
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS
- Publication number 20190285690
- Publication date Sep 19, 2019
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR
- Publication number 20180322025
- Publication date Nov 8, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REMOTE MONITORING OF SOFTWARE
- Publication number 20170339167
- Publication date Nov 23, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR
- Publication number 20170329685
- Publication date Nov 16, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR TESTING THROUGH SILICON VIAS IN 3D INTEGRATED CIRCUITS
- Publication number 20170261549
- Publication date Sep 14, 2017
- International Business Machines Corporation
- RAPHAEL P. ROBERTAZZI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS
- Publication number 20170067958
- Publication date Mar 9, 2017
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS
- Publication number 20160223606
- Publication date Aug 4, 2016
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS
- Publication number 20150247892
- Publication date Sep 3, 2015
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL (3D) STACKED INTEGRATED CIRCUIT TESTING
- Publication number 20120112776
- Publication date May 10, 2012
- International Business Machines Corporation
- Chen-Yong Cher
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR PROBE CARD POWER BUS NOISE REDUCTION
- Publication number 20080164895
- Publication date Jul 10, 2008
- Raphael Peter ROBERTAZZI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR PROBE CARD POWER BUS VOLTAGE DROP REDUCTION
- Publication number 20070013386
- Publication date Jan 18, 2007
- Raphael Peter Robertazzi
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR PROBE CARD POWER BUS VOLTAGE DROP REDUCTION
- Publication number 20060197548
- Publication date Sep 7, 2006
- Raphael Peter Robertazzi
- G01 - MEASURING TESTING

Raphael P. Robertazzi

Person

Patents Grantslast 30 patents

Method for the characterization and monitoring of integrated circuits

Detection of performance degradation in integrated circuits

Method for the characterization and monitoring of integrated circuits

Non-destructive analysis to determine use history of processor

Remote monitoring of software

Method for the characterization and monitoring of integrated circuits

Method for the characterization and monitoring of integrated circuits

Non-destructive analysis to determine use history of processor

Method for testing through silicon vias in 3D integrated circuits

Method for testing through silicon vias in 3D integrated circuits

Method for the characterization and monitoring of integrated circuits

Three-dimensional (3D) stacked integrated circuit testing

Device for probe card power bus voltage drop reduction

Device for probe card power bus voltage drop reduction

Device for probe card power bus noise reduction

Patents Applicationslast 30 patents

DETECTION OF PERFORMANCE DEGRADATION IN INTEGRATED CIRCUITS

METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS

METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS

NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR

REMOTE MONITORING OF SOFTWARE

NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR

METHOD FOR TESTING THROUGH SILICON VIAS IN 3D INTEGRATED CIRCUITS

METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS

METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS

METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS

THREE-DIMENSIONAL (3D) STACKED INTEGRATED CIRCUIT TESTING

DEVICE FOR PROBE CARD POWER BUS NOISE REDUCTION

DEVICE FOR PROBE CARD POWER BUS VOLTAGE DROP REDUCTION

DEVICE FOR PROBE CARD POWER BUS VOLTAGE DROP REDUCTION