Rasmus Schroeder

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Heidelberg, DE

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Patents Grantslast 30 patents

Information Patent Grant
Microtome and method for producing thin sections from a sample by m...
- Patent number 11,060,955
- Issue date Jul 13, 2021
- Karlsruher Institut fuer Technologie
- Waldemar Spomer
- G01 - MEASURING TESTING
Information Patent Grant
FIB-SEM array tomography
- Patent number 9,464,995
- Issue date Oct 11, 2016
- Carl Zeiss Microscopy GmbH
- Martin Edelmann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FIB-SEM ARRAY TOMOGRAPHY
- Publication number 20150036122
- Publication date Feb 5, 2015
- CARL ZEISS MICROSCOPY GMBH
- Martin Edelmann
- G01 - MEASURING TESTING