RAUL RAMON MOLINA IV

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HUTTO, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe card for testing semiconductor wafers
- Patent number 10,281,491
- Issue date May 7, 2019
- Translarity, Inc.
- Francis T. McQuade
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Socketed Probes
- Publication number 20240125815
- Publication date Apr 18, 2024
- TRANSLARITY, INC.
- Raul Molina
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR TESTING SEMICONDUCTOR WAFERS
- Publication number 20180149675
- Publication date May 31, 2018
- BUCKLINGBEAM
- FRANCIS T. MCQUADE
- G01 - MEASURING TESTING