Raul V. Tan

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and methods for measuring properties in a TSV structure u...
- Patent number 9,709,386
- Issue date Jul 18, 2017
- KLA-Tencor Corporation
- Lena Nicolaides
- G01 - MEASURING TESTING
Information Patent Grant
Lithographic process analysis and control system
- Patent number 4,890,239
- Issue date Dec 26, 1989
- Shipley Company, Inc.
- Christopher P. Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Characterization of semiconductor resist material during processing
- Patent number 4,874,240
- Issue date Oct 17, 1989
- Hoechst Celanese
- Michael P. C. Watts
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Absorption measurements of materials
- Patent number 4,857,738
- Issue date Aug 15, 1989
- General Signal Corporation
- David W. Myers
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY