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Ravichandar Reddy GEETLA
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Austin, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Circuitry and methods for fractional division of high-frequency clo...
Patent number
11,784,651
Issue date
Oct 10, 2023
NXP B.V.
Ravichandar Reddy Geetla
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Modified PID loop filter to suppress high frequency noise in digita...
Patent number
11,424,748
Issue date
Aug 23, 2022
NXP B.V.
Ravichandar Reddy Geetla
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Temperature sensor in an integrated circuit having offset cancellation
Patent number
10,852,197
Issue date
Dec 1, 2020
NXP USA, INC.
Ravichandar Reddy Geetla
G01 - MEASURING TESTING
Information
Patent Grant
Temperature sensor in an integrated circuit and method of calibrati...
Patent number
10,656,032
Issue date
May 19, 2020
NXP USA, INC.
Ravichandar Reddy Geetla
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CIRCUITRY AND METHODS FOR FRACTIONAL DIVISION OF HIGH-FREQUENCY CLO...
Publication number
20230126891
Publication date
Apr 27, 2023
NXP B.V.
Ravichandar Reddy Geetla
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
TEMPERATURE SENSOR IN AN INTEGRATED CIRCUIT HAVING OFFSET CANCELLATION
Publication number
20190310141
Publication date
Oct 10, 2019
NXP USA, Inc.
Ravichandar Reddy Geetla
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE SENSOR IN AN INTEGRATED CIRCUIT AND METHOD OF CALIBRATI...
Publication number
20180283963
Publication date
Oct 4, 2018
NXP USA, Inc.
Ravichandar Reddy GEETLA
G01 - MEASURING TESTING