Ravikumar Sanapala

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for dynamic care area generation on an inspection...
- Patent number 10,018,571
- Issue date Jul 10, 2018
- KLA-Tencor Corporation
- Vijayakumar Ramachandran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical mode analysis with design-based care areas
- Patent number 9,702,827
- Issue date Jul 11, 2017
- KLA-Tencor Corp.
- Bjorn Brauer
- G01 - MEASURING TESTING
Information Patent Grant
Wafer defect discovery
- Patent number 9,518,934
- Issue date Dec 13, 2016
- KLA-Tencor Corp.
- Hong Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Wafer Defect Discovery
- Publication number 20170076911
- Publication date Mar 16, 2017
- KLA-Tencor Corporation
- Hong Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Dynamic Care Area Generation on an Inspection...
- Publication number 20160377561
- Publication date Dec 29, 2016
- KLA-Tencor Corporation
- Vijayakumar Ramachandran
- G01 - MEASURING TESTING
Information Patent Application
Wafer Defect Discovery
- Publication number 20160123898
- Publication date May 5, 2016
- KLA-Tencor Corporation
- Hong Chen
- G01 - MEASURING TESTING