Ray D. Reid

Person

Glendora, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for detection of biohazard signatures in comple...
- Patent number 11,448,598
- Issue date Sep 20, 2022
- Photon Systems, Inc.
- Rohit Bhartia
- G01 - MEASURING TESTING
Information Patent Grant
Native fluorescence detection methods, devices, and systems for org...
- Patent number 11,262,301
- Issue date Mar 1, 2022
- Photon Systems, Inc.
- William F. Hug
- G01 - MEASURING TESTING
Information Patent Grant
Native fluorescence detection methods, devices, and systems for org...
- Patent number 10,895,533
- Issue date Jan 19, 2021
- Photon Systems, Inc.
- William F. Hug
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic chemical analysis methods and apparatus
- Patent number 10,890,533
- Issue date Jan 12, 2021
- Photon Systems, Inc.
- William F. Hug
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic chemical analysis methods and apparatus
- Patent number 10,753,863
- Issue date Aug 25, 2020
- Photon Systems, Inc.
- William F. Hug
- G01 - MEASURING TESTING
Information Patent Grant
Native fluorescence detection methods, devices, and systems for org...
- Patent number 10,598,596
- Issue date Mar 24, 2020
- Photon Systems, Inc.
- William F. Hug
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic chemical analysis methods and apparatus
- Patent number 9,915,603
- Issue date Mar 13, 2018
- Photon Systems, Inc.
- William F. Hug
- G01 - MEASURING TESTING
Information Patent Grant
Native fluorescence detection methods, devices, and systems for org...
- Patent number 9,909,990
- Issue date Mar 6, 2018
- Photon Systems, Inc.
- William F. Hug
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic chemical analysis methods and apparatus
- Patent number 9,568,418
- Issue date Feb 14, 2017
- Photon Systems, Inc.
- William F. Hug
- G01 - MEASURING TESTING
Information Patent Grant
Native fluorescence detection methods, devices, and systems for org...
- Patent number 9,442,070
- Issue date Sep 13, 2016
- Photon Systems, Inc.
- William F. Hug
- G01 - MEASURING TESTING
Information Patent Grant
Native fluorescence detection methods and detectors for naphthalene...
- Patent number 8,759,791
- Issue date Jun 24, 2014
- Photon Systems, Inc.
- William F. Hug
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic chemical analysis methods and apparatus
- Patent number 8,395,770
- Issue date Mar 12, 2013
- Photon Systems
- William F. Hug
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic chemical analysis methods and apparatus
- Patent number 7,800,753
- Issue date Sep 21, 2010
- Photon Systems
- William F. Hug
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam pumped semiconductor laser
- Patent number 7,590,161
- Issue date Sep 15, 2009
- Photon Systems
- William F. Hug
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic chemical analysis methods and apparatus
- Patent number 7,525,653
- Issue date Apr 28, 2009
- Photon Systems
- William F. Hug
- G01 - MEASURING TESTING
Information Patent Grant
Sputtering metal ion laser
- Patent number 6,693,944
- Issue date Feb 17, 2004
- William F. Hug
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analytical instrument using a sputtering metal ion laser
- Patent number 6,287,869
- Issue date Sep 11, 2001
- William F. Hug
- G01 - MEASURING TESTING
Information Patent Grant
System for rapidly producing either integrated circuits on a substr...
- Patent number 5,558,884
- Issue date Sep 24, 1996
- Omnichrome Corporation
- William F. Hug
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Inspection/detection system with a laser module for use in forensic...
- Patent number 5,072,338
- Issue date Dec 10, 1991
- William F. Hug
- G02 - OPTICS
Information Patent Grant
System for rapidly producing plastic parts
- Patent number 5,026,146
- Issue date Jun 25, 1991
- William F. Hug
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Elongated carrier with a plurality of spot-sources of heat for use...
- Patent number 4,943,928
- Issue date Jul 24, 1990
- Albert E. Campbell
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Inspection/detection system with a light module for use in forensic...
- Patent number 4,933,816
- Issue date Jun 12, 1990
- William F. Hug
- G02 - OPTICS

Ray D. Reid

Person

Patents Grantslast 30 patents

Methods and systems for detection of biohazard signatures in comple...

Native fluorescence detection methods, devices, and systems for org...

Native fluorescence detection methods, devices, and systems for org...

Spectroscopic chemical analysis methods and apparatus

Spectroscopic chemical analysis methods and apparatus

Native fluorescence detection methods, devices, and systems for org...

Spectroscopic chemical analysis methods and apparatus

Native fluorescence detection methods, devices, and systems for org...

Spectroscopic chemical analysis methods and apparatus

Native fluorescence detection methods, devices, and systems for org...

Native fluorescence detection methods and detectors for naphthalene...

Spectroscopic chemical analysis methods and apparatus

Spectroscopic chemical analysis methods and apparatus

Electron beam pumped semiconductor laser

Spectroscopic chemical analysis methods and apparatus

Sputtering metal ion laser

Analytical instrument using a sputtering metal ion laser

System for rapidly producing either integrated circuits on a substr...

Inspection/detection system with a laser module for use in forensic...

System for rapidly producing plastic parts

Elongated carrier with a plurality of spot-sources of heat for use...

Inspection/detection system with a light module for use in forensic...