Ray Jenn TSAY

Person

Taoyuan City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor Fab's defect operating system and method thereof
- Patent number 10,726,192
- Issue date Jul 28, 2020
- ELITE SEMICONDUCTOR INC.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SMART COORDINATE CONVERSION AND CALIBRATION SYSTEM IN SEMICONDUCTOR...
- Publication number 20210231582
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
SMART DEFECT CALIBRATION SYSTEM IN SEMICONDUCTOR WAFER MANUFACTURING
- Publication number 20210231584
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SMART CONVERSION AND CALIBRATION OF COORDINATE
- Publication number 20210231580
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PERFORMING SMART SEMICONDUCTOR WAFER DEFECT CALIBRATION
- Publication number 20210231581
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SMART CONVERSION AND CALIBRATION OF COORDINATE
- Publication number 20210231579
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
SMART COORDINATE CONVERSION AND CALIBRATION SYSTEM IN SEMICONDUCTOR...
- Publication number 20210231583
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR FAB'S DEFECT OPERATING SYSTEM AND METHOD THEREOF
- Publication number 20200026819
- Publication date Jan 23, 2020
- ELITE SEMICONDUCTOR INC.
- Iyun LEU
- G06 - COMPUTING CALCULATING COUNTING

Ray Jenn TSAY

Person

Patents Grantslast 30 patents

Semiconductor Fab's defect operating system and method thereof

Patents Applicationslast 30 patents

SMART COORDINATE CONVERSION AND CALIBRATION SYSTEM IN SEMICONDUCTOR...

SMART DEFECT CALIBRATION SYSTEM IN SEMICONDUCTOR WAFER MANUFACTURING

METHOD FOR SMART CONVERSION AND CALIBRATION OF COORDINATE

METHOD FOR PERFORMING SMART SEMICONDUCTOR WAFER DEFECT CALIBRATION

METHOD FOR SMART CONVERSION AND CALIBRATION OF COORDINATE

SMART COORDINATE CONVERSION AND CALIBRATION SYSTEM IN SEMICONDUCTOR...

SEMICONDUCTOR FAB'S DEFECT OPERATING SYSTEM AND METHOD THEREOF