Ray Wakefield

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Palo Alto, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for using probe card
- Patent number 8,120,375
- Issue date Feb 21, 2012
- Nextest Systems Corporation
- Craig Z. Foster
- G01 - MEASURING TESTING
Information Patent Grant
System for testing DUT and tester for use therewith
- Patent number 7,385,385
- Issue date Jun 10, 2008
- Nextest Systems Corporation
- Paul Magliocco
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for planarizing a probe card and method using same
- Patent number 7,098,650
- Issue date Aug 29, 2006
- Nextest Systems Corporation
- Craig Z. Foster
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe card and method for using probe card, wafer prober utilizing...
- Publication number 20060279302
- Publication date Dec 14, 2006
- Nextest Systems Corporation
- Craig Z. Foster
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for planarizing a probe card and method using same
- Publication number 20050062464
- Publication date Mar 24, 2005
- Craig Z. Foster
- G01 - MEASURING TESTING
Information Patent Application
Stackable semiconductor test system and method for operating same
- Publication number 20030062888
- Publication date Apr 3, 2003
- Paul Magliocco
- G01 - MEASURING TESTING