Raymond G. Stephany

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Hybrid coloring methodology for multi-pattern technology
- Patent number 10,175,571
- Issue date Jan 8, 2019
- QUALCOMM Incorporated
- Xiangdong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Variable interconnect pitch for improved performance
- Patent number 9,984,029
- Issue date May 29, 2018
- QUALCOMM Incorporated
- Kern Rim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Grounding dummy gate in scaled layout design
- Patent number 9,379,058
- Issue date Jun 28, 2016
- QUALCOMM Incorporated
- Stanley Seungchul Song
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact resistance test structure and methods of using same
- Patent number 7,391,226
- Issue date Jun 24, 2008
- Advanced Micro Devices, Inc.
- Mark W. Michael
- G01 - MEASURING TESTING
Information Patent Grant
High performance dynamic logic compatible and scannable transparent...
- Patent number 5,767,717
- Issue date Jun 16, 1998
- International Business Machines Corporation
- Eric Bernard Schorn
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HYBRID COLORING METHODOLOGY FOR MULTI-PATTERN TECHNOLOGY
- Publication number 20160370699
- Publication date Dec 22, 2016
- QUALCOMM Incorporated
- Xiangdong CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VARIABLE INTERCONNECT PITCH FOR IMPROVED PERFORMANCE
- Publication number 20150301973
- Publication date Oct 22, 2015
- QUALCOMM Incorporated
- Kern RIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GROUNDING DUMMY GATE IN SCALED LAYOUT DESIGN
- Publication number 20150235948
- Publication date Aug 20, 2015
- QUALCOMM Incorporated
- Stanley Seungchul SONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT RESISTANCE TEST STRUCTURE AND METHODS OF USING SAME
- Publication number 20070279064
- Publication date Dec 6, 2007
- Mark W. Michael
- G01 - MEASURING TESTING