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Raymond Garza
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Huntley, IL, US
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Patents Grants
last 30 patents
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Patent Grant
Semiconductor wafer having a thin die and tethers and methods of ma...
Patent number
6,881,648
Issue date
Apr 19, 2005
Motorola, Inc.
Shiuh-Hui Steven Chen
G01 - MEASURING TESTING
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Patent Grant
Semiconductor wafer having a thin die and tethers and methods of ma...
Patent number
6,608,370
Issue date
Aug 19, 2003
Motorola, Inc.
Shiuh-Hui Steven Chen
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Semiconductor wafer having a thin die and tethers and methods of ma...
Publication number
20030162322
Publication date
Aug 28, 2003
Shiuh-Hui Steven Chen
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR WAFER HAVING A THIN DIE AND TETHERS AND METHODS OF MA...
Publication number
20030141570
Publication date
Jul 31, 2003
Shiuh-Hui Steven Chen
G01 - MEASURING TESTING