Raymond Hill

Person

Rowley, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle detecting device and charged particle beam system...
- Patent number 10,037,862
- Issue date Jul 31, 2018
- Carl Zeiss Microscopy, LLC
- Sybren J. Sijbrandij
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,536,699
- Issue date Jan 3, 2017
- Carl Zeiss Microscopy, LLC
- John A. Notte
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,530,612
- Issue date Dec 27, 2016
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,530,611
- Issue date Dec 27, 2016
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 9,236,225
- Issue date Jan 12, 2016
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Ion sources, systems and methods
- Patent number 9,012,867
- Issue date Apr 21, 2015
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged particle detectors
- Patent number 9,000,396
- Issue date Apr 7, 2015
- Carl Zeiss Microscopy, LLC
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Variable energy charged particle systems
- Patent number 8,766,210
- Issue date Jul 1, 2014
- Carl Zeiss Microscopy, LLC
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 8,748,845
- Issue date Jun 10, 2014
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Dual beam system
- Patent number 8,399,864
- Issue date Mar 19, 2013
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 8,110,814
- Issue date Feb 7, 2012
- ALIS Corporation
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Deflection signal compensation for charged particle beam
- Patent number 8,101,928
- Issue date Jan 24, 2012
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual beam system
- Patent number 8,013,311
- Issue date Sep 6, 2011
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,786,452
- Issue date Aug 31, 2010
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,786,451
- Issue date Aug 31, 2010
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,745,801
- Issue date Jun 29, 2010
- ALIS Corporation
- Billy W. Ward
Information Patent Grant
Dual beam system
- Patent number 7,601,976
- Issue date Oct 13, 2009
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deflection signal compensation for charged particle beam
- Patent number 7,569,841
- Issue date Aug 4, 2009
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,557,358
- Issue date Jul 7, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,557,361
- Issue date Jul 7, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,557,360
- Issue date Jul 7, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,557,359
- Issue date Jul 7, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,554,096
- Issue date Jun 30, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,554,097
- Issue date Jun 30, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,521,693
- Issue date Apr 21, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,518,122
- Issue date Apr 14, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,511,280
- Issue date Mar 31, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,511,279
- Issue date Mar 31, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,504,639
- Issue date Mar 17, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,495,232
- Issue date Feb 24, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE DETECTING DEVICE AND CHARGED PARTICLE BEAM SYSTEM...
- Publication number 20170032925
- Publication date Feb 2, 2017
- Carl Zeiss Microscopy, LLC
- Sybren J. Sijbrandij
- G01 - MEASURING TESTING
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20150213997
- Publication date Jul 30, 2015
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...
- Publication number 20150008332
- Publication date Jan 8, 2015
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...
- Publication number 20150008341
- Publication date Jan 8, 2015
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...
- Publication number 20150008342
- Publication date Jan 8, 2015
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20140306121
- Publication date Oct 16, 2014
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
VARIABLE ENERGY CHARGED PARTICLE SYSTEMS
- Publication number 20120138815
- Publication date Jun 7, 2012
- CARL ZEISS NTS, LLC.
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20120141693
- Publication date Jun 7, 2012
- ALIS Corporation
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
CHARGED PARTICLE DETECTORS
- Publication number 20120068068
- Publication date Mar 22, 2012
- CARL ZEISS NTS, LLC.
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dual Beam System
- Publication number 20110309263
- Publication date Dec 22, 2011
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALIGNING CHARGED PARTICLE BEAMS
- Publication number 20110180722
- Publication date Jul 28, 2011
- CARL ZEISS NTS, LLC.
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON DETECTION SYSTEMS AND METHODS
- Publication number 20110127428
- Publication date Jun 2, 2011
- CARL ZEISS NTS, LLC.
- Raymond Hill
- G01 - MEASURING TESTING
Information Patent Application
Dual Beam System
- Publication number 20100025578
- Publication date Feb 4, 2010
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Deflection Signal Compensation for Charged Particle Beam
- Publication number 20090289196
- Publication date Nov 26, 2009
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20090179161
- Publication date Jul 16, 2009
- ALIS Corporation
- BILLY W. WARD
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20090114840
- Publication date May 7, 2009
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dual beam system
- Publication number 20080035860
- Publication date Feb 14, 2008
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion sources, systems and methods
- Publication number 20070221843
- Publication date Sep 27, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070210250
- Publication date Sep 13, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070210251
- Publication date Sep 13, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070205375
- Publication date Sep 6, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070194251
- Publication date Aug 23, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070194226
- Publication date Aug 23, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070187621
- Publication date Aug 16, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158555
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158556
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158558
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158557
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158580
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158581
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY

Raymond Hill

Person

Patents Grantslast 30 patents

Charged particle detecting device and charged particle beam system...

Charged particle beam system and method of operating a charged part...

Charged particle beam system and method of operating a charged part...

Charged particle beam system and method of operating a charged part...

Ion sources, systems and methods

Ion sources, systems and methods

Charged particle detectors

Variable energy charged particle systems

Ion sources, systems and methods

Dual beam system

Ion sources, systems and methods

Deflection signal compensation for charged particle beam

Dual beam system

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Dual beam system

Deflection signal compensation for charged particle beam

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Patents Applicationslast 30 patents

CHARGED PARTICLE DETECTING DEVICE AND CHARGED PARTICLE BEAM SYSTEM...

ION SOURCES, SYSTEMS AND METHODS

CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...

CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...

CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...

ION SOURCES, SYSTEMS AND METHODS

VARIABLE ENERGY CHARGED PARTICLE SYSTEMS

ION SOURCES, SYSTEMS AND METHODS

CHARGED PARTICLE DETECTORS

Dual Beam System

ALIGNING CHARGED PARTICLE BEAMS

ELECTRON DETECTION SYSTEMS AND METHODS

Dual Beam System

Deflection Signal Compensation for Charged Particle Beam

ION SOURCES, SYSTEMS AND METHODS

Ion sources, systems and methods

Dual beam system

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods