Raymond K. Eby

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Grayslake, IL, US

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Patents Grantslast 30 patents

Information Patent Grant
Identification features
- Patent number 8,235,302
- Issue date Aug 7, 2012
- Nanolnk, Inc.
- Cedric Loiret-Bernal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for aligning patterns on a substrate
- Patent number 8,043,652
- Issue date Oct 25, 2011
- NanoInk, Inc.
- Raymond K. Eby
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for aligning patterns on a substrate
- Patent number 7,279,046
- Issue date Oct 9, 2007
- Nanoink, Inc.
- Raymond K. Eby
- G01 - MEASURING TESTING
Information Patent Grant
Nanolithographic calibration methods
- Patent number 7,060,977
- Issue date Jun 13, 2006
- Nanoink, Inc.
- Sylvain Cruchon Dupeyrat
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IDENTIFICATION FEATURES
- Publication number 20100297190
- Publication date Nov 25, 2010
- NanoInk, Inc.
- Cedric Loiret-Bernal
- B30 - PRESSES
Information Patent Application
Identification features
- Publication number 20100294844
- Publication date Nov 25, 2010
- NanoInk, Inc.
- Cedric Loiret-Bernal
- B30 - PRESSES
Information Patent Application
METHOD AND APPARATUS FOR ALIGNING PATTERNS ON A SUBSTRATE
- Publication number 20080147346
- Publication date Jun 19, 2008
- Nanolnk, Inc.
- Raymond K. Eby
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for aligning patterns on a substrate
- Publication number 20030185967
- Publication date Oct 2, 2003
- Raymond K. Eby
- G01 - MEASURING TESTING