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Raymond Maldan Partosa
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Baguio City, PH
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Patents Grants
last 30 patents
Information
Patent Grant
Making a flip-chip assembly with bond fingers
Patent number
9,219,052
Issue date
Dec 22, 2015
Texas Instruments Incorporated
Raymond Maldan Partosa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Substrate with bond fingers
Patent number
8,766,461
Issue date
Jul 1, 2014
Texas Instruments Incorporated
Raymond Partosa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Bonding a solder bump to a lead using compression and retraction fo...
Patent number
8,381,967
Issue date
Feb 26, 2013
Texas Instruments Incorporated
Mutsumi Masumoto
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
System for detecting warped carriers and associated methods
Patent number
7,326,025
Issue date
Feb 5, 2008
Texas Instruments Incorporated
Ramil A. Viluan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wire bond integrity test system
Patent number
7,000,822
Issue date
Feb 21, 2006
Texas Instruments Incorporated
Allan I. Dacanay
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method of fabricating wire bond integrity test system
Patent number
6,808,943
Issue date
Oct 26, 2004
Texas Instruments Incorporated
Allan I. Dacanay
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Porous ceramic work stations for wire and die bonders
Patent number
6,650,011
Issue date
Nov 18, 2003
Texas Instruments Incorporated
Raymond M. Partosa
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
MAKING A FLIP-CHIP ASSEMBLY WITH BOND FINGERS
Publication number
20140248746
Publication date
Sep 4, 2014
TEXAS INSTRUMENTS INCORPORATED
Raymond Maldan Partosa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SUBSTRATE WITH BOND FINGERS
Publication number
20140197534
Publication date
Jul 17, 2014
TEXAS INSTRUMENTS INCORPORATED
Raymond Maldan Partosa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
System for detecting warped carriers and associated methods
Publication number
20050247541
Publication date
Nov 10, 2005
Texas Instruments, Inc.
Ramil A. Viluan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Wire bond integrity test system
Publication number
20050112787
Publication date
May 26, 2005
Allan I. Dacanay
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Wire bond integrity test system
Publication number
20030227016
Publication date
Dec 11, 2003
Allan I. Dacanay
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Porous ceramic work stations for wire and die bonders
Publication number
20030140470
Publication date
Jul 31, 2003
Raymond M. Partosa
H01 - BASIC ELECTRIC ELEMENTS