Raymond T. Leung

Person

Palo Alto, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Negative bias thermal instability stress testing of transistors
- Patent number 9,857,409
- Issue date Jan 2, 2018
- Synopsys, Inc.
- Jamil Kawa
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation of thermal instability stress testing
- Patent number 9,817,059
- Issue date Nov 14, 2017
- Synopsys, Inc.
- Jamil Kawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit skew compensation trigger system
- Patent number 9,742,406
- Issue date Aug 22, 2017
- Synopsys, Inc.
- Jamil Kawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Dynamic static random access memory (SRAM) array characterization u...
- Patent number 9,424,951
- Issue date Aug 23, 2016
- Synopsys, Inc.
- Raymond Tak-Hoi Leung
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory cell capable of storing more than two logic states by using...
- Patent number 5,982,659
- Issue date Nov 9, 1999
- LSI Logic Corporation
- V. Swamy Irrinki
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory circuit and method for multivalued logic storage by process...
- Patent number 5,867,423
- Issue date Feb 2, 1999
- LSI Logic Corporation
- Ashok Kapoor
- G11 - INFORMATION STORAGE
Information Patent Grant
Ram cell capable of storing 3 logic states
- Patent number 5,847,990
- Issue date Dec 8, 1998
- LSI Logic Corporation
- V. Swamy Irrinki
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system which enables storage and retrieval of more than two...
- Patent number 5,808,932
- Issue date Sep 15, 1998
- LSI Logic Corporation
- V. Swamy Irrinki
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system including an on-chip temperature sensor for regulatin...
- Patent number 5,784,328
- Issue date Jul 21, 1998
- LSI Logic Corporation
- V. Swamy Irrinki
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory cell capable of storing more than two logic states by using...
- Patent number 5,761,110
- Issue date Jun 2, 1998
- LSI Logic Corporation
- V. Swamy Irrinki
- G11 - INFORMATION STORAGE
Information Patent Grant
Low power programming circuit for user programmable digital logic a...
- Patent number 5,045,726
- Issue date Sep 3, 1991
- North American Philips Corporation
- Raymond T. Leung
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
EVALUATION OF THERMAL INSTABILITY STRESS TESTING
- Publication number 20150369855
- Publication date Dec 24, 2015
- Synopsys, Inc.
- Jamil Kawa
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT SKEW COMPENSATION TRIGGER SYSTEM
- Publication number 20150365075
- Publication date Dec 17, 2015
- Synopsys, Inc.
- Jamil Kawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DYNAMIC STATIC RANDOM ACCESS MEMORY (SRAM) ARRAY CHARACTERIZATION
- Publication number 20150063009
- Publication date Mar 5, 2015
- Synopsys, Inc.
- Raymond Tak-Hoi LEUNG
- G11 - INFORMATION STORAGE
Information Patent Application
NEGATIVE BIAS THERMAL INSTABILITY STRESS TESTING FOR STATIC RANDOM...
- Publication number 20150063010
- Publication date Mar 5, 2015
- Synopsys, Inc.
- Jamil KAWA
- G11 - INFORMATION STORAGE
Information Patent Application
NEGATIVE BIAS THERMAL INSTABILITY STRESS TESTING OF TRANSISTORS
- Publication number 20150061726
- Publication date Mar 5, 2015
- Synopsys, Inc.
- Jamil KAWA
- G01 - MEASURING TESTING

Raymond T. Leung

Person

Patents Grantslast 30 patents

Negative bias thermal instability stress testing of transistors

Evaluation of thermal instability stress testing

Circuit skew compensation trigger system

Dynamic static random access memory (SRAM) array characterization u...

Memory cell capable of storing more than two logic states by using...

Memory circuit and method for multivalued logic storage by process...

Ram cell capable of storing 3 logic states

Memory system which enables storage and retrieval of more than two...

Memory system including an on-chip temperature sensor for regulatin...

Memory cell capable of storing more than two logic states by using...

Low power programming circuit for user programmable digital logic a...

Patents Applicationslast 30 patents

EVALUATION OF THERMAL INSTABILITY STRESS TESTING

CIRCUIT SKEW COMPENSATION TRIGGER SYSTEM

DYNAMIC STATIC RANDOM ACCESS MEMORY (SRAM) ARRAY CHARACTERIZATION

NEGATIVE BIAS THERMAL INSTABILITY STRESS TESTING FOR STATIC RANDOM...

NEGATIVE BIAS THERMAL INSTABILITY STRESS TESTING OF TRANSISTORS