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Razvigor Ossikovski
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Villebon Sur Yvette, FR
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last 30 patents
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Patent Grant
Microscope having a multimode local probe, tip-enhanced raman micro...
Patent number
9,366,694
Issue date
Jun 14, 2016
Ecole Polytechnique
Marc Chaigneau
G01 - MEASURING TESTING
Information
Patent Grant
Polarimetric Raman system and method for analysing a sample
Patent number
7,859,661
Issue date
Dec 28, 2010
Ecole Polytechnique
Razvigor Ossikovski
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic ellipsometer modulated by an external excitation
Patent number
5,536,936
Issue date
Jul 16, 1996
Centre National de la Recherche
Bernard Drevillon
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Microscope Having A Multimode Local Probe, Tip-Enhanced Raman Micro...
Publication number
20160003866
Publication date
Jan 7, 2016
ECOLE POLYTECHNIQUE
Marc Chaigneau
G01 - MEASURING TESTING
Information
Patent Application
Polarimetric Raman System and Method For Analysing a Sample
Publication number
20080304061
Publication date
Dec 11, 2008
ECOLE POLYTECHNIQUE
Razvigor Ossikovski
G01 - MEASURING TESTING