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Reginald Hunter
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Round Rock, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for substrate imaging
Patent number
7,969,465
Issue date
Jun 28, 2011
Applied Materials, Inc.
Don T. Batson
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Sensor device for non-intrusive diagnosis of a semiconductor proces...
Patent number
7,434,485
Issue date
Oct 14, 2008
Applied Materials, Inc.
Reginald Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sensor device for non-intrusive diagnosis of a semiconductor proces...
Patent number
7,331,250
Issue date
Feb 19, 2008
Applied Materials, Inc.
Reginald Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus to provide for automated process verification...
Patent number
7,012,684
Issue date
Mar 14, 2006
Applied Materials, Inc.
Reginald Hunter
G01 - MEASURING TESTING
Information
Patent Grant
Sensor device for non-intrusive diagnosis of a semiconductor proces...
Patent number
6,895,831
Issue date
May 24, 2005
Applied Materials, Inc.
Reginald Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods for continuous embedded process monitoring and optical insp...
Patent number
6,882,416
Issue date
Apr 19, 2005
Applied Materials, Inc.
Reginald Hunter
G01 - MEASURING TESTING
Information
Patent Grant
Method for enhancing substrate processing
Patent number
6,878,636
Issue date
Apr 12, 2005
Applied Materials, Inc.
Joel Brad Bailey
B08 - CLEANING
Information
Patent Grant
Method and apparatus for enhanced embedded substrate inspection thr...
Patent number
6,813,032
Issue date
Nov 2, 2004
Applied Materials, Inc.
Reginald Hunter
G01 - MEASURING TESTING
Information
Patent Grant
Method for removing contamination particles from substrates
Patent number
6,805,137
Issue date
Oct 19, 2004
Applied Materials, Inc.
Joel Brad Bailey
B08 - CLEANING
Information
Patent Grant
Ultra low cost position and status monitoring using fiber optic del...
Patent number
6,803,998
Issue date
Oct 12, 2004
Applied Materials, Inc.
Reginald W. Hunter
G01 - MEASURING TESTING
Information
Patent Grant
Factory interface particle removal platform
Patent number
6,779,226
Issue date
Aug 24, 2004
Applied Materials, Inc.
Reginald W. Hunter
B08 - CLEANING
Information
Patent Grant
Processing platform with integrated particle removal system
Patent number
6,725,564
Issue date
Apr 27, 2004
Applied Materials, Inc.
Reginald W. Hunter
B08 - CLEANING
Information
Patent Grant
Method and apparatus to provide embedded substrate process monitori...
Patent number
6,721,045
Issue date
Apr 13, 2004
Applied Materials, Inc.
Reginald Hunter
G01 - MEASURING TESTING
Information
Patent Grant
Particle detection and embedded vision system to enhance substrate...
Patent number
6,707,544
Issue date
Mar 16, 2004
Applied Materials, Inc.
Reginald Hunter
G01 - MEASURING TESTING
Information
Patent Grant
Optical signal routing method and apparatus providing multiple insp...
Patent number
6,707,545
Issue date
Mar 16, 2004
Applied Materials, Inc.
Reginald Hunter
G01 - MEASURING TESTING
Information
Patent Grant
Particle detection and embedded vision system to enhance substrate...
Patent number
6,697,517
Issue date
Feb 24, 2004
Applied Magerials, Inc.
Reginald Hunter
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for substrate surface inspection using spectra...
Patent number
6,693,708
Issue date
Feb 17, 2004
Applied Materials, Inc.
Reginald Hunter
G01 - MEASURING TESTING
Information
Patent Grant
Particle removal apparatus
Patent number
6,684,523
Issue date
Feb 3, 2004
Applied Materials, Inc.
Joel Brad Bailey
B08 - CLEANING
Information
Patent Grant
Method for confirming alignment of a substrate support mechanism in...
Patent number
6,677,166
Issue date
Jan 13, 2004
Applied Materials, Inc.
Reginald Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Movable wireless sensor device for performing diagnostics with a su...
Patent number
6,642,853
Issue date
Nov 4, 2003
Applied Materials, Inc.
Reginald Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for embedded substrate and system status monit...
Patent number
6,630,995
Issue date
Oct 7, 2003
Applied Materials, Inc.
Reginald Hunter
G01 - MEASURING TESTING
Information
Patent Grant
Method for sensing conditions within a substrate processing system
Patent number
6,468,816
Issue date
Oct 22, 2002
Applied Materials, Inc.
Reginald Hunter
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Sensor device for non-intrusive diagnosis of a semiconductor proces...
Patent number
6,244,121
Issue date
Jun 12, 2001
Applied Materials, Inc.
Reginald Hunter
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Temperature control system for semiconductor processing facilities
Patent number
6,026,896
Issue date
Feb 22, 2000
Applied Materials, Inc.
Reginald Hunter
F28 - HEAT EXCHANGE IN GENERAL
Patents Applications
last 30 patents
Information
Patent Application
Next Generation Eyewear Retailing
Publication number
20080288369
Publication date
Nov 20, 2008
Reginald W. Hunter
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR SUBSTRATE IMAGING
Publication number
20070085905
Publication date
Apr 19, 2007
Don T. Batson
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SENSOR DEVICE FOR NON-INTRUSIVE DIAGNOSIS OF A SEMICONDUCTOR PROCES...
Publication number
20070022832
Publication date
Feb 1, 2007
Reginald Hunter
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
SENSOR DEVICE FOR NON-INTRUSIVE DIAGNOSIS OF A SEMICONDUCTOR PROCES...
Publication number
20060236793
Publication date
Oct 26, 2006
Reginald Hunter
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Sensor device for non-intrusive diagnosis of a semiconductor proces...
Publication number
20050126315
Publication date
Jun 16, 2005
APPLIED MATERIALS, INC.
Reginald Hunter
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method and apparatus for a chemical sensor
Publication number
20040203172
Publication date
Oct 14, 2004
URS CORPORATION
Curtis T. Laush
G01 - MEASURING TESTING
Information
Patent Application
Ultra low cost position and status monitoring using fiber optic del...
Publication number
20040036851
Publication date
Feb 26, 2004
APPLIED MATERIALS, INC.
Reginald W. Hunter
G01 - MEASURING TESTING
Information
Patent Application
Sensor device for non-intrusive diagnosis of a semiconductor proces...
Publication number
20030209097
Publication date
Nov 13, 2003
APPLIED MATERIALS, INC.
Reginald Hunter
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Particle removal apparatus
Publication number
20030037457
Publication date
Feb 27, 2003
APPLIED MATERIALS, INC.
Joel Brad Bailey
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for enhancing substrate processing
Publication number
20030040193
Publication date
Feb 27, 2003
APPLIED MATERIALS, INC.
Joel Brad Bailey
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for removing contamination particles from substrate processi...
Publication number
20030037800
Publication date
Feb 27, 2003
APPLIED MATERIALS, INC.
Joel Brad Bailey
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for removing contamination particles from substrates
Publication number
20030037803
Publication date
Feb 27, 2003
APPLIED MATERIALS, INC.
Joel Brad Bailey
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Factory interface particle removal platform
Publication number
20030037400
Publication date
Feb 27, 2003
APPLIED MATERIALS, INC.
Reginald W. Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Substrate support apparatus to facilitate particle removal
Publication number
20030039087
Publication date
Feb 27, 2003
APPLIED MATERIALS, INC.
Steven Gianoulakis
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for increasing the efficiency of substrate processing chambe...
Publication number
20030037801
Publication date
Feb 27, 2003
APPLIED MATERIALS, INC.
Joel Brad Bailey
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Processing platform with integrated particle removal system
Publication number
20030037456
Publication date
Feb 27, 2003
APPLIED MATERIALS, INC.
Reginald W. Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for substrate imaging
Publication number
20020196336
Publication date
Dec 26, 2002
APPLIED MATERIALS, INC.
Don T. Batson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for confirming alignment of a substrate support mechanism in...
Publication number
20020092369
Publication date
Jul 18, 2002
Applied Materials Inc.
Reginald Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for confirming alignment of a substrate support mechanism in...
Publication number
20020078770
Publication date
Jun 27, 2002
APPLIED MATERIALS, INC.
Reginald Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Sensor device for non-intrusive diagnosis of a semiconductor proces...
Publication number
20010042414
Publication date
Nov 22, 2001
APPLIED MATERIALS, INC.
Reginald Hunter
H01 - BASIC ELECTRIC ELEMENTS