Reginald R. Bowley JR.

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Essex Junction, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Array foreshortening measurement using a critical dimension scannin...
- Patent number 6,683,306
- Issue date Jan 27, 2004
- International Business Machines Corporation
- Reginald R. Bowley
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining opened/unopened semiconductor contacts using...
- Patent number 6,414,308
- Issue date Jul 2, 2002
- International Business Machines Corporation
- Reginald R. Bowley
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Contact hole profile and line edge width metrology for critical ima...
- Publication number 20040267506
- Publication date Dec 30, 2004
- International Business Machines Corporation
- Reginald R. Bowley
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Contact hole profile and line edge width metrology for critical ima...
- Publication number 20030158710
- Publication date Aug 21, 2003
- International Business Machines Corporation
- Reginald R. Bowley
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Array foreshortening measurement using a critical dimension scannin...
- Publication number 20020185598
- Publication date Dec 12, 2002
- International Business Machines Corporation
- Reginald R. Bowley
- G01 - MEASURING TESTING