Rehan Sheikh

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for wireless device testing
- Patent number 10,247,773
- Issue date Apr 2, 2019
- Intel Corporation
- Sankaran M. Menon
- G01 - MEASURING TESTING
Information Patent Grant
Circuit marginality validation test for an integrated circuit
- Patent number 9,229,720
- Issue date Jan 5, 2016
- Intel Corporation
- Antonio Castro
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR WIRELESS DEVICE TESTING
- Publication number 20180003764
- Publication date Jan 4, 2018
- Intel Corporation
- Sankaran M. Menon
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT MARGINALITY VALIDATION TEST FOR AN INTEGRATED CIRCUIT
- Publication number 20080244235
- Publication date Oct 2, 2008
- Antonio Castro
- G06 - COMPUTING CALCULATING COUNTING